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Citation: V. Balu et al., DIELECTRIC-DISPERSION IN BARIUM STRONTIUM-TITANATE THIN-FILM CAPACITORS WITH IRIDIUM ELECTRODES, Integrated ferroelectrics (Print), 21(1-4), 1998, pp. 155-166

Authors: HADAD D CHEN TS BALU V JIANG B KUAH SH MCINTYRE P SUMMERFELT S ANTHONY JM LEE JC

Citation: D. Hadad et al., THE EFFECTS OF FORMING GAS ANNEAL ON THE ELECTRICAL CHARACTERISTICS OF IR-ELECTRODED BST THIN-FILM CAPACITORS, Integrated ferroelectrics, 17(1-4), 1997, pp. 461-469

Authors: KUAH S BALU V CHEN TS JIANG B HADAD D WHITE B JONES RE ZURCHER P MELNICK B GILLESPIE S LEE JC

Citation: S. Kuah et al., INTERACTION OF IR AND IRO2 THIN-FILMS WITH POLYSILICON, W AND WSIX, Integrated ferroelectrics, 17(1-4), 1997, pp. 479-488

Authors: CHEN TS BALU V JIANG B KUAH SH LEE JC CHU P JONES RE ZURCHER P TAYLOR DJ GILLESPIE S

Citation: Ts. Chen et al., STABILITY OF REACTIVE DC-SPUTTERED IR AND IRO2 THIN-FILMS IN VARIOUS AMBIENTS, Integrated ferroelectrics, 16(1-4), 1997, pp. 191-198