Citation: C. Constancias et R. Baptist, EMISSION OBSERVATION OF A MICROTIP CATHODE ARRAY WITH AN ELECTROSTATIC-LENS PROJECTOR - STATISTICAL APPROACH, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(2), 1998, pp. 841-850
Citation: St. Purcell et al., NANOPROTRUSION MODEL FOR FIELD-EMISSION FROM INTEGRATED MICROTIPS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(5), 1997, pp. 1666-1677
Citation: R. Baptist et al., MICROTIPS AND RESISTIVE SHEET - A THEORETICAL DESCRIPTION OF THE EMISSIVE PROPERTIES OF THIS SYSTEM, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(2), 1997, pp. 385-390
Citation: R. Baptist, TRENDS AND DEVELOPMENTS OF VACUUM MICROEL ECTRONICS IN EUROPE - INTERNATIONAL-VACUUM-MICROELECTRONICS-CONFERENCE - 7-12 JULY 1996 - SAINT PETERSBURG (RUSSIA), Le Vide, 52(282), 1996, pp. 499
Citation: R. Baptist et al., BAYARD-ALPERT VACUUM GAUGE WITH MICROTIPS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(3), 1996, pp. 2119-2125
Citation: R. Baptist et R. Meyer, PAPERS FROM THE 7TH INTERNATIONAL VACUUM MICROELECTRONICS CONFERENCE - 4-7 JULY 1994, GRENOBLE, FRANCE - PREFACE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(2), 1995, pp. 402-402
Citation: C. Py et R. Baptist, LOW-ENERGY-ELECTRON INTERFERENCE WITH SPINDT-TYPE MICROTIPS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(2), 1995, pp. 410-413
Authors:
LEVINE JD
MEYER R
BAPTIST R
FELTER TE
TALIN AA
Citation: Jd. Levine et al., FIELD-EMISSION FROM MICROTIP TEST ARRAYS USING RESISTOR STABILIZATION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(2), 1995, pp. 474-477
Citation: C. Py et R. Baptist, STABILITY OF THE EMISSION OF A MICROTIP, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(2), 1994, pp. 685-688
Citation: R. Baptist, PROCEEDINGS OF THE 7TH INTERNATIONAL-CONF ERENCE ON ULTRAVACUUM MICROELECTRONICS JOINTLY ORGANIZED BY SFV AND LETI-CEA TECHNOLOGIE AVANCEES- JULY 4-7, 1994, AT THE ATRIA IN GRENOBLE, FRANCE, Le Vide, les couches minces, 50(274), 1994, pp. 477-479