Authors: NAZAROV AN COLINGE JP BARCHUK IP

Citation: An. Nazarov et al., RESEARCH OF HIGH-TEMPERATURE INSTABILITY PROCESSES IN BURIED DIELECTRIC OF FULL DEPLETED SOI MOSFETS, Microelectronic engineering, 36(1-4), 1997, pp. 363-366

Authors: BARCHUK IP KILCHITSKAYA VI LYSENKO VS NAZAROV AN RUDENKO TE DJURENKO SV RUDENKO AN YURCHENKO AP BALLUTAUD D COLINGE JP

Citation: Ip. Barchuk et al., ELECTRICAL-PROPERTIES AND RADIATION HARDNESS OF SOI SYSTEMS WITH MULTILAYER BURIED DIELECTRIC, IEEE transactions on nuclear science, 44(6), 1997, pp. 2542-2552