Authors: PASSERI D BARONCINI M CIAMPOLINI P BILEI GM SANTOCCHIA A CHECCUCCI B FIANDRINI E

Citation: D. Passeri et al., TCAD-BASED ANALYSIS OF RADIATION-HARDNESS IN SILICON DETECTORS, IEEE transactions on nuclear science, 45(3), 1998, pp. 602-608

Authors: PASSERI D CIAMPOLINI P BARONCINI M

Citation: D. Passeri et al., COMPREHENSIVE MODELING OF SILICON MICROSTRIP DETECTORS, IEEE transactions on nuclear science, 44(3), 1997, pp. 598-605