Authors: VALLISHAYEE RR ORSZAG SA JACKSON E BAROUCH E

Citation: Rr. Vallishayee et al., MANUFACTURABILITY OF ELECTRONIC CHIPS, Theoretical and computational fluid dynamics, 10(1-4), 1998, pp. 407-423

Authors: BAROUCH E HOLLERBACH U ORSZAG SA

Citation: E. Barouch et al., DEFOCUS ASYMMETRY IN PROJECTION PRINTING, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 3778-3782

Authors: MASNOU JL AGRINIER B BAROUCH E COMTE R COSTA E CHRISTY JC CUSUMANO G GERARDI G LEMOINE D MANDROU P MASSARO E MATT G MINEO T NIEL M OLIVE JF PARLIER B SACCO B SALVATI M SCARSI L

Citation: Jl. Masnou et al., THE RADIO-GAMMA TIME-DELAY OF THE CRAB PULSAR, Astronomy and astrophysics, 290(2), 1994, pp. 503-509

Authors: ROTHSCHILD M DORAN SP BAROUCH E HOLLERBACH U ORSZAG SA

Citation: M. Rothschild et al., EVALUATION OF DEPTH-OF-FOCUS IN PHOTOLITHOGRAPHY AT 193 AND 248 NM FOR FEATURE SIZES OF 0.25 MU-M AND BELOW, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(6), 1993, pp. 2720-2724

Authors: SHERWIN SJ BAROUCH E KARNIADAKIS GE ORSZAG SA

Citation: Sj. Sherwin et al., MODELING OF MULTILAYER ION ETCHING PROCESSES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(4), 1993, pp. 1310-1313