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Citation: Pw. Wang et S. Bater, DEPTH PROFILE OF CHEMICAL-SPECIES IN MULTIPLE DOPED TRIMETHYLSILANE FILM ON SI(100) SURFACES BY LOW-ENERGY AR IONS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 141(1-4), 1998, pp. 181-186

Authors: WANG PW SULAK J BATER S ZHANG LP CRAIG JH

Citation: Pw. Wang et al., X-RAY PHOTON AND THERMAL EFFECTS ON TRIMETHYLSILANE COVERED SI(100) SURFACES, Thin solid films, 304(1-2), 1997, pp. 160-165

Authors: WANG PW BATER S ZHANG LP ASCHERL M CRAIG JH

Citation: Pw. Wang et al., XPS INVESTIGATION OF ELECTRON-BEAM EFFECTS ON A TRIMETHYLSILANE DOSEDSI(100) SURFACE, Applied surface science, 90(4), 1995, pp. 413-417