Authors:
CZERWIEC T
GAVILLET J
BELMONTE T
MICHEL H
RICARD A
Citation: T. Czerwiec et al., DETERMINATION OF O ATOM DENSITY IN AR-O, AND AR-O-2-H-2 FLOWING MICROWAVE DISCHARGES, Surface & coatings technology, 98(1-3), 1998, pp. 1411-1415
Authors:
BELMONTE T
BOCKEL S
BORDOT C
ABLITZER D
MICHEL H
Citation: T. Belmonte et al., MEASUREMENT OF THE LOSS PROBABILITY OF NITROGEN-ATOMS AT 823 K ON IRON NITRIDE EPSILON-FE2N1-X, Applied surface science, 135(1-4), 1998, pp. 259-268
Authors:
BOCKEL S
HESS E
BELMONTE T
ABLITZER D
MICHEL H
Citation: S. Bockel et al., MODELING OF IRON NITRIDE LAYERS GROWTH DURING NITRIDING OF PURE IRON SUBSTRATES, Revue de métallurgie, 95(5), 1998, pp. 651-658
Citation: A. Ricard et al., EMISSION-SPECTROSCOPY DETECTION OF N-2 ACTIVE SPECIES IN PLASMA NITRIDING PROCESS, Czechoslovak Journal of Physics, 48(10), 1998, pp. 1253-1260
Authors:
BELMONTE T
GAVILLET J
CZERWIEC T
ABLITZER D
MICHEL H
Citation: T. Belmonte et al., HYDRODYNAMIC AND CHEMICAL MODELING OF A CHEMICAL-VAPOR-DEPOSITION REACTOR FOR ZIRCONIA DEPOSITION, Journal de physique. III, 7(9), 1997, pp. 1779-1796
Authors:
BELMONTE T
CZERWIEC T
GAVILLET J
MICHEL H
Citation: T. Belmonte et al., SYNTHESIS OF ZIRCONIA THIN-FILMS BY RPECVD MODELING OF AR-O-2 POSTDISCHARGE AND COMPARISON BETWEEN AR-O-2 AND AR-O-2-H-2 POSTDISCHARGES PROCESSES, Surface & coatings technology, 97(1-3), 1997, pp. 642-648
Citation: J. Gavillet et al., LOW-TEMPERATURE ZIRCONIA THIN-FILM SYNTHESIS BY A CHEMICAL-VAPOR-DEPOSITION PROCESS INVOLVING ZRCL4 AND O-2-H-2-AR MICROWAVE POSTDISCHARGES- COMPARISON WITH A CONVENTIONAL CVD HYDROLYSIS PROCESS, Thin solid films, 301(1-2), 1997, pp. 35-44
Authors:
CZERWIEC T
GAVILLET J
BELMONTE T
MICHEL H
RICARD A
Citation: T. Czerwiec et al., DETERMINATION OF N AND O ATOM DENSITY IN AR-N-2-H-2 AND AR-O-2-H-2 FLOWING MICROWAVE POST DISCHARGES, Journal de physique. III, 6(9), 1996, pp. 1205-1212
Citation: T. Belmonte et al., SYNTHESIS OF SILICON-CARBIDE WHISKERS USING THE VAPOR-LIQUID-SOLID MECHANISM IN A SILICON-RICH DROPLET, Journal of Materials Science, 31(9), 1996, pp. 2367-2371