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Results: 1-13 |
Results: 13

Authors: PIERSON JF CZERWIEC T BELMONTE T MICHEL H RICARD A
Citation: Jf. Pierson et al., KINETICS OF BORON ATOMS IN AR-BCL3 FLOWING MICROWAVE DISCHARGES, Plasma sources science & technology, 7(1), 1998, pp. 54-60

Authors: CZERWIEC T GAVILLET J BELMONTE T MICHEL H RICARD A
Citation: T. Czerwiec et al., DETERMINATION OF O ATOM DENSITY IN AR-O, AND AR-O-2-H-2 FLOWING MICROWAVE DISCHARGES, Surface & coatings technology, 98(1-3), 1998, pp. 1411-1415

Authors: BELMONTE T BOCKEL S BORDOT C ABLITZER D MICHEL H
Citation: T. Belmonte et al., MEASUREMENT OF THE LOSS PROBABILITY OF NITROGEN-ATOMS AT 823 K ON IRON NITRIDE EPSILON-FE2N1-X, Applied surface science, 135(1-4), 1998, pp. 259-268

Authors: BOCKEL S HESS E BELMONTE T ABLITZER D MICHEL H
Citation: S. Bockel et al., MODELING OF IRON NITRIDE LAYERS GROWTH DURING NITRIDING OF PURE IRON SUBSTRATES, Revue de métallurgie, 95(5), 1998, pp. 651-658

Authors: RICARD A BELMONTE T BOCKEL S MICHEL H
Citation: A. Ricard et al., EMISSION-SPECTROSCOPY DETECTION OF N-2 ACTIVE SPECIES IN PLASMA NITRIDING PROCESS, Czechoslovak Journal of Physics, 48(10), 1998, pp. 1253-1260

Authors: BELMONTE T GAVILLET J CZERWIEC T ABLITZER D MICHEL H
Citation: T. Belmonte et al., HYDRODYNAMIC AND CHEMICAL MODELING OF A CHEMICAL-VAPOR-DEPOSITION REACTOR FOR ZIRCONIA DEPOSITION, Journal de physique. III, 7(9), 1997, pp. 1779-1796

Authors: BOCKEL S BELMONTE T MICHEL H ABLITZER D
Citation: S. Bockel et al., 3D MODELING OF A MICROWAVE POSTDISCHARGE NITRIDING REACTOR, Surface & coatings technology, 97(1-3), 1997, pp. 618-625

Authors: BELMONTE T CZERWIEC T GAVILLET J MICHEL H
Citation: T. Belmonte et al., SYNTHESIS OF ZIRCONIA THIN-FILMS BY RPECVD MODELING OF AR-O-2 POSTDISCHARGE AND COMPARISON BETWEEN AR-O-2 AND AR-O-2-H-2 POSTDISCHARGES PROCESSES, Surface & coatings technology, 97(1-3), 1997, pp. 642-648

Authors: PIERSON JF CZERWIEC T BELMONTE T MICHEL H
Citation: Jf. Pierson et al., DIAGNOSTIC OF AR-BCL3 MICROWAVE DISCHARGES BY OPTICAL-EMISSION SPECTROSCOPY, Surface & coatings technology, 97(1-3), 1997, pp. 749-754

Authors: GAVILLET J BELMONTE T HERTZ D MICHEL H
Citation: J. Gavillet et al., LOW-TEMPERATURE ZIRCONIA THIN-FILM SYNTHESIS BY A CHEMICAL-VAPOR-DEPOSITION PROCESS INVOLVING ZRCL4 AND O-2-H-2-AR MICROWAVE POSTDISCHARGES- COMPARISON WITH A CONVENTIONAL CVD HYDROLYSIS PROCESS, Thin solid films, 301(1-2), 1997, pp. 35-44

Authors: CZERWIEC T GAVILLET J BELMONTE T MICHEL H RICARD A
Citation: T. Czerwiec et al., DETERMINATION OF N AND O ATOM DENSITY IN AR-N-2-H-2 AND AR-O-2-H-2 FLOWING MICROWAVE POST DISCHARGES, Journal de physique. III, 6(9), 1996, pp. 1205-1212

Authors: BELMONTE T BONNETAIN L GINOUX JL
Citation: T. Belmonte et al., GAS-FLOW NATURE INFLUENCE ON SILICON-CARBIDE WHISKERS SYNTHESIS IN FIXED-BED, Vacuum, 47(3), 1996, pp. 291-295

Authors: BELMONTE T BONNETAIN L GINOUX JL
Citation: T. Belmonte et al., SYNTHESIS OF SILICON-CARBIDE WHISKERS USING THE VAPOR-LIQUID-SOLID MECHANISM IN A SILICON-RICH DROPLET, Journal of Materials Science, 31(9), 1996, pp. 2367-2371
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