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Authors: BINTZ WJ MCGRUER NE
Citation: Wj. Bintz et Ne. Mcgruer, SIO2-INDUCED SILICON EMITTER EMISSION INSTABILITY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(2), 1994, pp. 697-699

Authors: MCGRUER NE BROWNING J MEASSICK S GILMORE M BINTZ WJ CHAN C
Citation: Ne. Mcgruer et al., ION-SPACE-CHARGE INITIATION OF GATED FIELD EMITTER FAILURE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(2), 1993, pp. 441-444
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