Citation: Wj. Bintz et Ne. Mcgruer, SIO2-INDUCED SILICON EMITTER EMISSION INSTABILITY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(2), 1994, pp. 697-699
Authors:
MCGRUER NE
BROWNING J
MEASSICK S
GILMORE M
BINTZ WJ
CHAN C
Citation: Ne. Mcgruer et al., ION-SPACE-CHARGE INITIATION OF GATED FIELD EMITTER FAILURE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(2), 1993, pp. 441-444