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2 INTERFEROMETRIC METHODS FOR THE MECHANICAL CHARACTERIZATION OF THIN-FILMS BY BULGING TESTS - APPLICATION TO SINGLE-CRYSTAL OF SILICON
Authors: BONNOTTE E DELOBELLE P BORNIER L TROLARD B TRIBILLON G
Citation: E. Bonnotte et al., 2 INTERFEROMETRIC METHODS FOR THE MECHANICAL CHARACTERIZATION OF THIN-FILMS BY BULGING TESTS - APPLICATION TO SINGLE-CRYSTAL OF SILICON, Journal of materials research, 12(9), 1997, pp. 2234-2248
SILICON-BASED INTEGRATED INTERFEROMETER WITH PHASE MODULATION DRIVEN BY SURFACE ACOUSTIC-WAVES
Authors: GORECKI C CHOLLET F BONNOTTE E KAWAKATSU H
Citation: C. Gorecki et al., SILICON-BASED INTEGRATED INTERFEROMETER WITH PHASE MODULATION DRIVEN BY SURFACE ACOUSTIC-WAVES, Optics letters, 22(23), 1997, pp. 1784-1786
PRESENTATION OF 2 INTERFEROMETRIC METHODS USED FOR THE CHARACTERIZATION OF MECHANICAL-PROPERTIES OF THIN-FILMS WITH BULGE TESTS - APPLICATION TO SILICON SINGLE-CRYSTAL
Authors: BONNOTTE E DELOBELLE P BORNIER L TROLARD B TRIBILLON G
Citation: E. Bonnotte et al., PRESENTATION OF 2 INTERFEROMETRIC METHODS USED FOR THE CHARACTERIZATION OF MECHANICAL-PROPERTIES OF THIN-FILMS WITH BULGE TESTS - APPLICATION TO SILICON SINGLE-CRYSTAL, Journal de physique. III, 5(7), 1995, pp. 953-983
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