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Results: 1-11 |
Results: 11

Authors: KUNERT HW MALHERBE JB BRINK DJ
Citation: Hw. Kunert et al., OPTICAL CHARACTERIZATION OF AR-IMPLANTED AND ANNEALED GAAS DOPING SUPERLATTICES( ION), Applied surface science, 135(1-4), 1998, pp. 29-36

Authors: DEENAPANRAY PNK PERRET NE BRINK DJ AURET FD MALHERBE JB
Citation: Pnk. Deenapanray et al., CHARACTERIZATION OF OPTICALLY-ACTIVE DEFECTS CREATED BY NOBLE-GAS ION-BOMBARDMENT OF SILICON, Journal of applied physics, 83(8), 1998, pp. 4075-4080

Authors: BRINK DJ LEE ME
Citation: Dj. Brink et Me. Lee, THIN-FILM BIOLOGICAL REFLECTORS - OPTICAL CHARACTERIZATION OF THE CHRYSIRIDIA-CROESUS MOTH, Applied optics, 37(19), 1998, pp. 4213-4217

Authors: KUNERT HW BRINK DJ
Citation: Hw. Kunert et Dj. Brink, OPTICAL-PROPERTIES OF ALPHA-IRRADIATED AND ANNEALED SI-DOPED GAAS, Journal of applied physics, 81(10), 1997, pp. 6948-6953

Authors: ARNOLD PA BENSON DR BRINK DJ HENDRICH MP JAS GS KENNEDY ML PETASIS DT WANG MX
Citation: Pa. Arnold et al., HELIX INDUCTION AND SPRINGBOARD STRAIN IN PEPTIDE-SANDWICHED MESOHEMES, Inorganic chemistry, 36(23), 1997, pp. 5306-5315

Authors: BRINK DJ LEE ME
Citation: Dj. Brink et Me. Lee, ELLIPSOMETRY OF DIFFRACTIVE INSECT REFLECTORS, Applied optics, 35(12), 1996, pp. 1950-1955

Authors: KUNERT HW BRINK DJ GOUWS GJ
Citation: Hw. Kunert et al., DEFECT LUMINESCENCE BANDS IN MOCVD-GROWN CDTE ON GAAS, Thin solid films, 268(1-2), 1995, pp. 98-101

Authors: BRINK DJ KUNERT HW
Citation: Dj. Brink et Hw. Kunert, PHOTOLUMINESCENCE OF CDTE THIN-FILMS CONTAINING A MIXED-CRYSTAL ORIENTATION, Journal of applied physics, 78(11), 1995, pp. 6720-6725

Authors: BRINK DJ SMIT JE LEE ME MOLLER A
Citation: Dj. Brink et al., OPTICAL DIFFRACTION BY THE MICROSTRUCTURE OF THE WING OF A MOTH, Applied optics, 34(27), 1995, pp. 6049-6057

Authors: BRINK DJ ZWANEPOEL HJ
Citation: Dj. Brink et Hj. Zwanepoel, A SIMPLE LOW-COST ROTATING Q-SWITCH FOR ALEXANDRITE LASERS, Measurement science & technology, 4(8), 1993, pp. 846-849

Authors: BRINK DJ SMIT JE
Citation: Dj. Brink et Je. Smit, DETECTION AND CHARACTERIZATION OF TRANSIENT SURFACE PERIODIC STRUCTURES FORMED DURING PULSED-LASER ANNEALING OF SEMICONDUCTOR SURFACES BY ELLIPSOMETRY, Thin solid films, 233(1-2), 1993, pp. 189-193
Risultati: 1-11 |