Authors: TOLAN M PRESS W BRINKOP F KOTTHAUS JP

Citation: M. Tolan et al., X-RAY-DIFFRACTION FROM LATERALLY STRUCTURED SURFACES - TOTAL EXTERNALREFLECTION, Physical review. B, Condensed matter, 51(4), 1995, pp. 2239-2251

Authors: TOLAN M BAHR D SUSSENBACH J PRESS W BRINKOP F KOTTHAUS JP

Citation: M. Tolan et al., COHERENCE LENGTH DETERMINATION OF X-RAYS WITH LATERALLY STRUCTURED SURFACES, Physica. B, Condensed matter, 198(1-3), 1994, pp. 55-57

Authors: TOLAN M PRESS W BRINKOP F KOTTHAUS JP

Citation: M. Tolan et al., X-RAY-DIFFRACTION FROM LATERALLY STRUCTURED SURFACES - CRYSTAL TRUNCATION RODS, Journal of applied physics, 75(12), 1994, pp. 7761-7769

Authors: MULLERBUSCHBAUM P TOLAN M PRESS W BRINKOP F KOTTHAUS JP

Citation: P. Mullerbuschbaum et al., WETTING OF LATERALLY STRUCTURED SURFACES, Berichte der Bunsengesellschaft fur Physikalische Chemie, 98(3), 1994, pp. 413-414