Authors: GOSSNER H BRODBECK T

Citation: H. Gossner et T. Brodbeck, DANGEROUS PARASITICS OF SOCKETED CDM ESD TESTERS, Microelectronics and reliability, 37(10-11), 1997, pp. 1465-1468

Authors: BRODBECK T BAUCH H GUGGENMOS X WAGNER R

Citation: T. Brodbeck et al., REPRODUCIBILITY OF FIELD FAILURES BY ESD MODELS - COMPARISON OF HBM, SOCKETED CDM ON NON-SOCKETED CDM, Microelectronics and reliability, 36(11-12), 1996, pp. 1719-1722