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Authors: HARTWIG J BAKMISIUK J BERGER H BRUHL HG OKADA Y GROSSWIG S WOKULSKA K WOLF J
Citation: J. Hartwig et al., COMPARISON OF LATTICE-PARAMETERS OBTAINED FROM AN INTERNAL SILICON MONOCRYSTAL STANDARD, Physica status solidi. a, Applied research, 142(1), 1994, pp. 19-26

Authors: BRUHL HG POECKER A NICKEL H LOSCH R SCHLAPP W
Citation: Hg. Bruhl et al., HIGH-RESOLUTION X-RAY-DIFFRACTION OF MOLECULAR-BEAM-EPITAXY-GROWN INALAS INGAAS/INALAS 3-LAYER STRUCTURES ON (001)-ORIENTED INP-SUBSTRATES/, Journal of applied crystallography, 26, 1993, pp. 645-649

Authors: BAUMBACH GT OELGART G BRUHL HG PIETSCH U TUNCEL E GENOUD FM MARTIN D REINHART FK LENGELER B
Citation: Gt. Baumbach et al., CHARACTERIZATION OF A SUPERLATTICE WITH AN ENLARGED WELL BY SYNCHROTRON RADIATION AND PHOTOLUMINESCENCE, Semiconductor science and technology, 7(3), 1992, pp. 304-310
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