Authors:
HARTWIG J
BAKMISIUK J
BERGER H
BRUHL HG
OKADA Y
GROSSWIG S
WOKULSKA K
WOLF J
Citation: J. Hartwig et al., COMPARISON OF LATTICE-PARAMETERS OBTAINED FROM AN INTERNAL SILICON MONOCRYSTAL STANDARD, Physica status solidi. a, Applied research, 142(1), 1994, pp. 19-26
Authors:
BRUHL HG
POECKER A
NICKEL H
LOSCH R
SCHLAPP W
Citation: Hg. Bruhl et al., HIGH-RESOLUTION X-RAY-DIFFRACTION OF MOLECULAR-BEAM-EPITAXY-GROWN INALAS INGAAS/INALAS 3-LAYER STRUCTURES ON (001)-ORIENTED INP-SUBSTRATES/, Journal of applied crystallography, 26, 1993, pp. 645-649
Authors:
BAUMBACH GT
OELGART G
BRUHL HG
PIETSCH U
TUNCEL E
GENOUD FM
MARTIN D
REINHART FK
LENGELER B
Citation: Gt. Baumbach et al., CHARACTERIZATION OF A SUPERLATTICE WITH AN ENLARGED WELL BY SYNCHROTRON RADIATION AND PHOTOLUMINESCENCE, Semiconductor science and technology, 7(3), 1992, pp. 304-310