AAAAAA

   
Results: 1-3 |
Results: 3
ATOMIC-FORCE MICROSCOPY STRESS SENSORS FOR STUDIES IN LIQUIDS
Authors: OSHEA SJ WELLAND ME BRUNT TA RAMADAN AR RAYMENT T
Citation: Sj. Oshea et al., ATOMIC-FORCE MICROSCOPY STRESS SENSORS FOR STUDIES IN LIQUIDS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1383-1385
MEASURING SURFACE STRESS-INDUCED BY ELECTRODE PROCESSES USING A MICROMECHANICAL SENSOR
Authors: BRUNT TA CHABALA ED RAYMENT T OSHEA SJ WELLAND ME
Citation: Ta. Brunt et al., MEASURING SURFACE STRESS-INDUCED BY ELECTRODE PROCESSES USING A MICROMECHANICAL SENSOR, Journal of the Chemical Society. Faraday transactions, 92(20), 1996, pp. 3807-3812
MEASURING THE SURFACE STRESSES IN AN ELECTROCHEMICALLY DEPOSITED METAL MONOLAYER - PB ON AU(111)
Authors: BRUNT TA RAYMENT T OSHEA SJ WELLAND ME
Citation: Ta. Brunt et al., MEASURING THE SURFACE STRESSES IN AN ELECTROCHEMICALLY DEPOSITED METAL MONOLAYER - PB ON AU(111), Langmuir, 12(24), 1996, pp. 5942-5946
Risultati: 1-3 |