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Results: 1-13 |
Results: 13
HARDNESS, ELASTIC-MODULUS AND STRUCTURE OF INDIUM NITRIDE THIN-FILMS ON ALN-NUCLEATED SAPPHIRE SUBSTRATES
Authors: EDGAR JH WEI CH SMITH DT KISTENMACHER TJ BRYDEN WA
Citation: Jh. Edgar et al., HARDNESS, ELASTIC-MODULUS AND STRUCTURE OF INDIUM NITRIDE THIN-FILMS ON ALN-NUCLEATED SAPPHIRE SUBSTRATES, Journal of materials science. Materials in electronics, 8(5), 1997, pp. 307-312
UNIVERSAL AGENT SENSOR FOR COUNTERPROLIFERATION APPLICATIONS
Authors: BRYDEN WA BENSON RC KO HW DONLON M
Citation: Wa. Bryden et al., UNIVERSAL AGENT SENSOR FOR COUNTERPROLIFERATION APPLICATIONS, Johns Hopkins APL technical digest, 18(2), 1997, pp. 302-308
ADVANCED SENSORS - GUEST EDITORS INTRODUCTION
Authors: BRYDEN WA SUTER JJ
Citation: Wa. Bryden et Jj. Suter, ADVANCED SENSORS - GUEST EDITORS INTRODUCTION, Johns Hopkins APL technical digest, 16(3), 1995, pp. 220-221
DEVELOPMENT OF ALXGA1-XN ALLOY SEMICONDUCTORS FOR SOLAR-BLIND ULTRAVIOLET SEEKER APPLICATIONS
Authors: WICKENDEN DK BRYDEN WA KISTENMACHER TJ BYTHROW PF STROHBEHN K
Citation: Dk. Wickenden et al., DEVELOPMENT OF ALXGA1-XN ALLOY SEMICONDUCTORS FOR SOLAR-BLIND ULTRAVIOLET SEEKER APPLICATIONS, Johns Hopkins APL technical digest, 16(3), 1995, pp. 246-257
ALUMINUM NITRIDE ON SAPPHIRE FILMS FOR SURFACE-ACOUSTIC-WAVE CHEMICALSENSORS
Authors: SUTER JJ BRYDEN WA KISTENMACHER TJ PORGA RD
Citation: Jj. Suter et al., ALUMINUM NITRIDE ON SAPPHIRE FILMS FOR SURFACE-ACOUSTIC-WAVE CHEMICALSENSORS, Johns Hopkins APL technical digest, 16(3), 1995, pp. 288-295
THE TINY-TOF MASS-SPECTROMETER FOR CHEMICAL AND BIOLOGICAL SENSING
Authors: BRYDEN WA BENSON RC ECELBERGER SA PHILLIPS TE COTTER RJ FENSELAU C
Citation: Wa. Bryden et al., THE TINY-TOF MASS-SPECTROMETER FOR CHEMICAL AND BIOLOGICAL SENSING, Johns Hopkins APL technical digest, 16(3), 1995, pp. 296-310
EPR PERSISTENCE MEASUREMENTS OF UV-INDUCED MELANIN FREE-RADICALS IN WHOLE SKIN
Authors: COLLINS B POEHLER TO BRYDEN WA
Citation: B. Collins et al., EPR PERSISTENCE MEASUREMENTS OF UV-INDUCED MELANIN FREE-RADICALS IN WHOLE SKIN, Photochemistry and photobiology, 62(3), 1995, pp. 557-560
HE N2 REACTIVE GAS-COMPOSITION AND THE STRUCTURAL AND ELECTRICAL-PROPERTIES OF INN THIN-FILMS GROWN ON ALN-NUCLEATED (00.1) SAPPHIRE BY PLANAR MAGNETRON SPUTTERING/
Authors: BRYDEN WA ECELBERGER SA KISTENMACHER TJ
Citation: Wa. Bryden et al., HE N2 REACTIVE GAS-COMPOSITION AND THE STRUCTURAL AND ELECTRICAL-PROPERTIES OF INN THIN-FILMS GROWN ON ALN-NUCLEATED (00.1) SAPPHIRE BY PLANAR MAGNETRON SPUTTERING/, Thin solid films, 247(2), 1994, pp. 258-263
THERMALLY ANNEALED GAN NUCLEATION LAYERS AND THE DEVICE-QUALITY METAL-ORGANIC CHEMICAL-VAPOR-DEPOSITION GROWTH OF SI-DOPED GAN FILMS ON (00.1) SAPPHIRE
Authors: WICKENDEN DK MIRAGLIOTTA JA BRYDEN WA KISTENMACHER TJ
Citation: Dk. Wickenden et al., THERMALLY ANNEALED GAN NUCLEATION LAYERS AND THE DEVICE-QUALITY METAL-ORGANIC CHEMICAL-VAPOR-DEPOSITION GROWTH OF SI-DOPED GAN FILMS ON (00.1) SAPPHIRE, Journal of applied physics, 75(11), 1994, pp. 7585-7587
HIGH-QUALITY SELF-NUCLEATED ALXGA1-X N LAYERS ON (00.1) SAPPHIRE BY LOW-PRESSURE METALORGANIC CHEMICAL-VAPOR-DEPOSITION
Authors: WICKENDEN DK BARGERON CB BRYDEN WA MIRAGLIOTTA J KISTENMACHER TJ
Citation: Dk. Wickenden et al., HIGH-QUALITY SELF-NUCLEATED ALXGA1-X N LAYERS ON (00.1) SAPPHIRE BY LOW-PRESSURE METALORGANIC CHEMICAL-VAPOR-DEPOSITION, Applied physics letters, 65(16), 1994, pp. 2024-2026
HETEROEPITAXIAL GROWTH OF INN ON ALN-NUCLEATED (00.1) SAPPHIRE BY ULTRAHIGH-VACUUM ELECTRON-CYCLOTRON RESONANCE-ASSISTED REACTIVE MAGNETRONSPUTTERING
Authors: BRYDEN WA ECELBERGER SA KISTENMACHER TJ
Citation: Wa. Bryden et al., HETEROEPITAXIAL GROWTH OF INN ON ALN-NUCLEATED (00.1) SAPPHIRE BY ULTRAHIGH-VACUUM ELECTRON-CYCLOTRON RESONANCE-ASSISTED REACTIVE MAGNETRONSPUTTERING, Applied physics letters, 64(21), 1994, pp. 2864-2866
LINEAR-OPTICAL AND NONLINEAR-OPTICAL PROPERTIES OF GAN THIN-FILMS
Authors: MIRAGLIOTTA J WICKENDEN DK KISTENMACHER TJ BRYDEN WA
Citation: J. Miragliotta et al., LINEAR-OPTICAL AND NONLINEAR-OPTICAL PROPERTIES OF GAN THIN-FILMS, Journal of the Optical Society of America. B, Optical physics, 10(8), 1993, pp. 1447-1456
STRUCTURAL AND ELECTRICAL-PROPERTIES OF REACTIVELY SPUTTERED INN THIN-FILMS ON ALN-BUFFERED (00.1) SAPPHIRE SUBSTRATES - DEPENDENCE ON BUFFER AND FILM GROWTH TEMPERATURES AND THICKNESSES
Authors: KISTENMACHER TJ ECELBERGER SA BRYDEN WA
Citation: Tj. Kistenmacher et al., STRUCTURAL AND ELECTRICAL-PROPERTIES OF REACTIVELY SPUTTERED INN THIN-FILMS ON ALN-BUFFERED (00.1) SAPPHIRE SUBSTRATES - DEPENDENCE ON BUFFER AND FILM GROWTH TEMPERATURES AND THICKNESSES, Journal of applied physics, 74(3), 1993, pp. 1684-1691
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