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Results: 1-10 |
Results: 10
EXAMINATION OF WEAR MECHANISMS OF HARD COATINGS
Authors: NIEBUHR T BUBERT H STEFFENS HD HAUMANN D KAUDER K DAMGEN U
Citation: T. Niebuhr et al., EXAMINATION OF WEAR MECHANISMS OF HARD COATINGS, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 278-280
STUDY OF STRESSED HARD COATINGS AND OF THEIR ABRASIVE PARTICLES BY AES AND REM
Authors: NIEBUHR T BUBERT H DAMGEN U KAUDER K
Citation: T. Niebuhr et al., STUDY OF STRESSED HARD COATINGS AND OF THEIR ABRASIVE PARTICLES BY AES AND REM, Mikrochimica acta, 125(1-4), 1997, pp. 127-130
SURFACE ANALYTICAL EXAMINATIONS OF WELDED NICKEL-ALLOYS BY XPS, SNMS AND SEM EDX/
Authors: PAJONK G STEFFENS HD REZNIK B BUBERT H JENETT H
Citation: G. Pajonk et al., SURFACE ANALYTICAL EXAMINATIONS OF WELDED NICKEL-ALLOYS BY XPS, SNMS AND SEM EDX/, Mikrochimica acta, 125(1-4), 1997, pp. 375-380
CHARACTERIZATION OF SIOXNYHZ AND SINYHZ USING RBS, ERDA AND NRA - IN-MEMORIAM PRIV-DOZ DR GARTEN,RAINER,P.H
Authors: WIELUNSKI M BUBERT H GARTEN RPH
Citation: M. Wielunski et al., CHARACTERIZATION OF SIOXNYHZ AND SINYHZ USING RBS, ERDA AND NRA - IN-MEMORIAM PRIV-DOZ DR GARTEN,RAINER,P.H, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 111(1-2), 1996, pp. 115-125
QUANTITATIVE AUGER-ELECTRON SPECTROMETRIC DEPTH PROFILE ANALYSIS OF BINARY ALLOY REFERENCE MATERIALS
Authors: GARTEN RPH BUBERT H
Citation: Rph. Garten et H. Bubert, QUANTITATIVE AUGER-ELECTRON SPECTROMETRIC DEPTH PROFILE ANALYSIS OF BINARY ALLOY REFERENCE MATERIALS, Fresenius' journal of analytical chemistry, 353(3-4), 1995, pp. 351-353
COMPARATIVE INVESTIGATION ON COPPER OXIDES BY DEPTH PROFILING USING XPS, RBS AND GDOES
Authors: BUBERT H GRALLATH E QUENTMEIER A WIELUNSKI M BORUCKI L
Citation: H. Bubert et al., COMPARATIVE INVESTIGATION ON COPPER OXIDES BY DEPTH PROFILING USING XPS, RBS AND GDOES, Fresenius' journal of analytical chemistry, 353(3-4), 1995, pp. 456-463
CONTRIBUTION TO THE CHARACTERIZATION OF REFERENCE MATERIALS FOR THIN-FILM ANALYSIS IN SOLAR-ENERGY AND SEMICONDUCTOR TECHNOLOGIES
Authors: GARTEN RPH BUBERT H PALMETSHOFER L KOROL VM
Citation: Rph. Garten et al., CONTRIBUTION TO THE CHARACTERIZATION OF REFERENCE MATERIALS FOR THIN-FILM ANALYSIS IN SOLAR-ENERGY AND SEMICONDUCTOR TECHNOLOGIES, Fresenius' journal of analytical chemistry, 349(1-3), 1994, pp. 176-177
MATRIX FACTORS AFFECTING QUANTITATIVE-ANALYSIS OF AES FOR BINARY-ALLOYS
Authors: BUBERT H GARTEN RPH
Citation: H. Bubert et Rph. Garten, MATRIX FACTORS AFFECTING QUANTITATIVE-ANALYSIS OF AES FOR BINARY-ALLOYS, Applied surface science, 81(2), 1994, pp. 203-214
APPLICATION OF FACTOR-ANALYSIS IN ELECTRON SPECTROSCOPIC DEPTH PROFILING ON COPPER-OXIDE
Authors: BUBERT H KORTE M GARTEN RPH GRALLATH E WIELUNSKI M
Citation: H. Bubert et al., APPLICATION OF FACTOR-ANALYSIS IN ELECTRON SPECTROSCOPIC DEPTH PROFILING ON COPPER-OXIDE, Analytica chimica acta, 297(1-2), 1994, pp. 187-195
HETEROGENEOUS ELEMENT DISTRIBUTION - A CONTRIBUTION TO QUANTITATIVE GDOS DEPTH ANALYSIS
Authors: DESSENNE O QUENTMEIER A BUBERT H
Citation: O. Dessenne et al., HETEROGENEOUS ELEMENT DISTRIBUTION - A CONTRIBUTION TO QUANTITATIVE GDOS DEPTH ANALYSIS, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 340-345
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