Authors: SCHLEMM H BUCHMANN F

Citation: H. Schlemm et F. Buchmann, MASS-SEPARATED BROAD-BEAM ION-IMPLANTATION OF 25 KEV N+ IN TITANIUM, Surface & coatings technology, 97(1-3), 1997, pp. 259-262

Authors: BUCHMANN F GEILER HD

Citation: F. Buchmann et Hd. Geiler, SURFACE CHARACTERIZATION OF SEMICONDUCTORS WITH PLASMA AND THERMAL WAVES ANALYSIS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 96(1-2), 1995, pp. 113-117

Authors: KAPPLINGER S BUCHMANN F GEILER HD

Citation: S. Kapplinger et al., MEASUREMENT OF SURFACE RECOMBINATION OF EXCESS CARRIERS BY USE OF THEDOUBLE-MODULATION TECHNIQUE, Journal de physique. IV, 4(C7), 1994, pp. 145-149

Authors: DEROOY TPW OESTMANN JW KOOL LJS VROOMAN H BUCHMANN F

Citation: Tpw. Derooy et al., ADVANCED MULTIPLE-BEAM EQUALIZATION RADIOGRAPHY (AMBER) COMBINED WITHCOMPUTED RADIOGRAPHY - PRELIMINARY EVALUATION, Acta radiologica, 34(5), 1993, pp. 445-449