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Results: 1-10 |
Results: 10
IN-SITU EXAMINATION OF THE CHEMICAL ETCHING OF SIO2-SI STRUCTURES USING AN ATOMIC-FORCE MICROSCOPE
Authors: BUKHARAEV AA BUKHARAEVA AA NURGAZIZOV NI OVCHINNIKOV DV
Citation: Aa. Bukharaev et al., IN-SITU EXAMINATION OF THE CHEMICAL ETCHING OF SIO2-SI STRUCTURES USING AN ATOMIC-FORCE MICROSCOPE, Technical physics letters, 24(11), 1998, pp. 863-865
INVESTIGATION OF MICROMAGNETISM AND MAGNETIC REVERSAL OF NI NANOPARTICLES USING A MAGNETIC FORCE MICROSCOPE
Authors: BUKHARAEV AA OVCHINNIKOV DV NURGAZIZOV NI KUKOVITSKII EF KLAIBER M WIESENDANGER R
Citation: Aa. Bukharaev et al., INVESTIGATION OF MICROMAGNETISM AND MAGNETIC REVERSAL OF NI NANOPARTICLES USING A MAGNETIC FORCE MICROSCOPE, Physics of the solid state, 40(7), 1998, pp. 1163-1168
SCANNING FORCE MICROSCOPY OF CATALYTIC NICKEL PARTICLES PREPARED FROMCARBON NANOTUBES
Authors: BUKHARAEV AA KUKOVITSKII EF OVCHINNIKOV DV SAINOV NA NURGAZIZOV NI
Citation: Aa. Bukharaev et al., SCANNING FORCE MICROSCOPY OF CATALYTIC NICKEL PARTICLES PREPARED FROMCARBON NANOTUBES, Physics of the solid state, 39(11), 1997, pp. 1846-1851
ATOMIC-FORCE MICROSCOPY OF LASER-INDUCED SUBMICROMETER PERIODIC STRUCTURES ON IMPLANTED FUSED-SILICA AND SILICON
Authors: BUKHARAEV AA JANDUGANOV VM SAMARSKY EA BERDUNOV NV
Citation: Aa. Bukharaev et al., ATOMIC-FORCE MICROSCOPY OF LASER-INDUCED SUBMICROMETER PERIODIC STRUCTURES ON IMPLANTED FUSED-SILICA AND SILICON, Applied surface science, 103(1), 1996, pp. 49-54
SCANNING TUNNELING AND ATOMIC-FORCE MICRO SCOPY STUDIES OF SURFACES MODIFIED BY ION AND LASER-BEAMS
Authors: BUKHARAEV AA
Citation: Aa. Bukharaev, SCANNING TUNNELING AND ATOMIC-FORCE MICRO SCOPY STUDIES OF SURFACES MODIFIED BY ION AND LASER-BEAMS, Uspehi fiziceskih nauk, 166(2), 1996, pp. 210-213
EFFECTS OF STIMULATED ADSORPTION IN SCANNING-TUNNELING-MICROSCOPY INVESTIGATION OF SI SURFACE IN AMBIENT AIR
Authors: BUKHARAEV AA SAMARSKY EA JANDUGANOV VM BERDUNOV NV ANTONOV PG
Citation: Aa. Bukharaev et al., EFFECTS OF STIMULATED ADSORPTION IN SCANNING-TUNNELING-MICROSCOPY INVESTIGATION OF SI SURFACE IN AMBIENT AIR, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(3), 1995, pp. 1274-1279
ATOMIC-FORCE MICROSCOPY OF SUBMICRON STRU CTURES FORMED BY IONIC AND LASER-BEAMS
Authors: BUKHARAEV AA LOBKOV VS YANDUGANOV VM SAMARSKII EA BERDUNOV NV
Citation: Aa. Bukharaev et al., ATOMIC-FORCE MICROSCOPY OF SUBMICRON STRU CTURES FORMED BY IONIC AND LASER-BEAMS, Pis'ma v Zurnal tehniceskoj fiziki, 21(15), 1995, pp. 72-77
SCANNING PROBE MICROSCOPY OF DIFFRACTION GRATINGS INDUCED BY LASER-RADIATION
Authors: BUKHARAEV AA LOBKOV VS YANDUGANOV VM SAMARSKII EA BERDUNOV NV
Citation: Aa. Bukharaev et al., SCANNING PROBE MICROSCOPY OF DIFFRACTION GRATINGS INDUCED BY LASER-RADIATION, Optika i spektroskopia, 79(3), 1995, pp. 417-425
DIAGNOSIS OF A SURFACE BY SCANNING-TUNNELING-MICROSCOPY (REVIEW)
Authors: BUKHARAEV AA
Citation: Aa. Bukharaev, DIAGNOSIS OF A SURFACE BY SCANNING-TUNNELING-MICROSCOPY (REVIEW), Industrial laboratory, 60(10), 1994, pp. 589-598
ANALYSIS OF THE DEPTH PROFILE OF FE-SI BURIED LAYERS IN FE-IMPLANTED SI WAFER BY SOFT-X-RAY EMISSION-SPECTROSCOPY()
Authors: GALAKHOV VR KURMAEV EZ SHAMIN SN ELOKHINA LV YARMOSHENKO YM BUKHARAEV AA
Citation: Vr. Galakhov et al., ANALYSIS OF THE DEPTH PROFILE OF FE-SI BURIED LAYERS IN FE-IMPLANTED SI WAFER BY SOFT-X-RAY EMISSION-SPECTROSCOPY(), Applied surface science, 72(1), 1993, pp. 73-77
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