Authors: BURTON JC SUN L POPHRISTIC M LUKACS SJ LONG FH FENG ZC FERGUSON IT

Citation: Jc. Burton et al., SPATIAL CHARACTERIZATION OF DOPED SIC WAFERS BY RAMAN-SPECTROSCOPY, Journal of applied physics, 84(11), 1998, pp. 6268-6273

Authors: BHATT PP REMSBERG EE SCHMIDLIN FJ GORDLEY LL BURTON JC

Citation: Pp. Bhatt et al., ON THE DETERMINATION OF BIASES IN SATELLITE-DERIVED TEMPERATURE PROFILES, Geophysical research letters, 21(12), 1994, pp. 1145-1148

Authors: RODGERS TJ EICHEN SP MORGAN JF SALDICH RJ BARTH M MCCANN C BURTON JC

Citation: Tj. Rodgers et al., TAKING ACCOUNT OF STOCK-OPTIONS, Harvard business review, 72(1), 1994, pp. 27