Authors: Lysenko, VS Nazarov, AN Kilchytska, VI Osiyuk, IN Tyagulski, IP Gomeniuk, YV Barchuk, IP

Citation: Vs. Lysenko et al., Thermally activated processes in the buried oxide of SIMOX SOI structures and devices, SOL ST ELEC, 45(4), 2001, pp. 575-584

Authors: Nazarov, AN Kilchytska, VI Barchuk, IP Tkachenko, AS Ashok, S

Citation: An. Nazarov et al., Radio frequency plasma annealing of positive charge generated by Fowler-Nordheim electron injection in buried oxides in silicon, J VAC SCI B, 18(3), 2000, pp. 1254-1261

Authors: Nazarov, AN Barchuk, IP Lysenko, VS Colinge, JP

Citation: An. Nazarov et al., Association of high-temperature kink-effect in SIMOX SOI fully depleted n-MOSFET with bias temperature instability of buried oxide, MICROEL ENG, 48(1-4), 1999, pp. 379-382