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Results:
1-19
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Results: 19
Authors:
Lucadamo, G
Barmak, K
Carpenter, DT
Rickman, JM
Citation: G. Lucadamo et al., Microstructure evolution during solid state reactions of Nb/Al multilayers, ACT MATER, 49(14), 2001, pp. 2813-2826
Authors:
Lucadamo, G
Barmak, K
Rodbell, KP
Citation: G. Lucadamo et al., Texture in Ti/Al and Nb/Al multilayer thin films: Role of Cu, J MATER RES, 16(5), 2001, pp. 1449-1459
Authors:
Crew, DC
Kim, J
Lewis, LH
Barmak, K
Citation: Dc. Crew et al., Interdiffusion in bilayer CoPt/Co films: potential for tailoring the magnetic exchange spring, J MAGN MAGN, 233(3), 2001, pp. 257-273
Authors:
Lucadamo, G
Barmak, K
Citation: G. Lucadamo et K. Barmak, Stress evolution in polycrystalline thin film reactions, THIN SOL FI, 389(1-2), 2001, pp. 8-11
Authors:
Tong, WS
Rickman, JM
Barmak, K
Citation: Ws. Tong et al., Impact of short-range repulsive interactions between nuclei on the evolution of a phase transformation, J CHEM PHYS, 114(2), 2001, pp. 915-922
Authors:
Crew, DC
Lewis, LH
Kim, J
Barmak, K
Citation: Dc. Crew et al., Magnetic signature of compositional gradient in exchange-spring bilayer films of CoPt/Co, J APPL PHYS, 89(11), 2001, pp. 7528-7530
Authors:
Tong, WS
Rickman, JM
Barmak, K
Citation: Ws. Tong et al., Evolution of perimeter fraction during a phase transformation, ACT MATER, 48(5), 2000, pp. 1181-1186
Authors:
Lucadamo, G
Barmak, K
Hyun, S
Citation: G. Lucadamo et al., Nb/Al and Nb/Al(Cu) multilayer thin films: the enthalpy of formation of NbAl3, THERMOC ACT, 348(1-2), 2000, pp. 53-59
Authors:
Kim, J
Barmak, K
De Graef, M
Lewis, LH
Crew, DC
Citation: J. Kim et al., Effect of annealing on magnetic exchange coupling in CoPt/Co bilayer thin films, J APPL PHYS, 87(9), 2000, pp. 6140-6142
Authors:
Barmak, K
Lucadamo, GA
Cabral, C
Lavoie, C
Harper, JME
Citation: K. Barmak et al., Dissociation of dilute immiscible copper alloy thin films, J APPL PHYS, 87(5), 2000, pp. 2204-2214
Authors:
Carpenter, DT
Watanabe, M
Barmak, K
Williams, DB
Citation: Dt. Carpenter et al., Low-magnification quantitative X-ray mapping of grain-boundary segregationin aluminum-4 wt.% copper by analytical electron microscopy, MICROS MICR, 5(4), 1999, pp. 254-266
Authors:
Lucadamo, G
Watanabe, M
Barmak, K
Williams, DB
Michaelsen, C
Alani, R
Citation: G. Lucadamo et al., High-resolution quantitative X-ray microanalysis of Nb Al multilayer thin films using the zeta-factor approach, PHIL MAG A, 79(6), 1999, pp. 1423-1442
Authors:
Tong, WS
Rickman, JM
Barmak, K
Citation: Ws. Tong et al., Quantitative analysis of spatial distribution of nucleation sites: Microstructural implications, ACT MATER, 47(2), 1999, pp. 435-445
Authors:
Ristau, RA
Barmak, K
Coffey, KR
Howard, JK
Citation: Ra. Ristau et al., Grain growth in ultrathin films of CoPt and FePt, J MATER RES, 14(8), 1999, pp. 3263-3270
Authors:
Barmak, K
Rickman, JM
Michaelsen, C
Ristau, RA
Kim, J
Lucadamo, GA
Carpenter, DT
Tong, WS
Citation: K. Barmak et al., Ex situ characterization of phase transformations and associated microstructures in polycrystalline thin films, J VAC SCI A, 17(4), 1999, pp. 1950-1957
Authors:
Carpenter, DT
Codner, JR
Barmak, K
Rickman, JM
Citation: Dt. Carpenter et al., Issues associated with the analysis and acquisition of thin-film grain size data, MATER LETT, 41(6), 1999, pp. 296-302
Authors:
Lucadamo, G
Barmak, K
Hyun, S
Cabral, C
Lavoie, C
Citation: G. Lucadamo et al., Evidence of a two-stage reaction mechanism in sputter deposited Nb Al multilayer thin-films studied by in situ synchrotron X-ray diffraction, MATER LETT, 39(5), 1999, pp. 268-273
Authors:
Banovic, SW
Barmak, K
Marder, AR
Citation: Sw. Banovic et al., Characterization of single and discretely-stepped electro-composite coatings of nickel-alumina, J MATER SCI, 34(13), 1999, pp. 3203-3211
Authors:
Ristau, RA
Barmak, K
Lewis, LH
Coffey, KR
Howard, JK
Citation: Ra. Ristau et al., On the relationship of high coercivity and L1(0) ordered phase in CoPt andFePt thin films, J APPL PHYS, 86(8), 1999, pp. 4527-4533
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