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Results:
1-14
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Results: 14
Authors:
Benko, E
Barr, TL
Hardcastle, S
Hoppe, E
Bernasik, A
Morgiel, J
Citation: E. Benko et al., XPS study of the cBN-TiC system, CERAM INT, 27(6), 2001, pp. 637-643
Authors:
Seal, S
Barr, TL
Krezoski, S
Petering, D
Citation: S. Seal et al., Surface modification of silicon and silica in biological environment: an X-ray photoelectron spectroscopy study, APPL SURF S, 173(3-4), 2001, pp. 339-351
Authors:
Benko, E
Wyczesany, A
Barr, TL
Citation: E. Benko et al., CBN-metal/metal nitride composites, CERAM INT, 26(6), 2000, pp. 639-644
Authors:
Benko, E
Wyczesany, A
Bernasik, A
Barr, TL
Hoope, E
Citation: E. Benko et al., CBN-Cr/Cr3C2 composite materials: chemical equilibria, XPS investigations, CERAM INT, 26(5), 2000, pp. 545-550
Authors:
Pawlak, DA
Wozniak, K
Frukacz, Z
Barr, TL
Fiorentino, D
Seal, S
Citation: Da. Pawlak et al., ESCA studies of yttrium aluminum garnets, J PHYS CH B, 103(9), 1999, pp. 1454-1461
Authors:
Pawlak, DA
Wozniak, K
Frukacz, Z
Barr, TL
Fiorentino, D
Hardcastle, S
Citation: Da. Pawlak et al., ESCA studies of yttrium orthoaluminum perovskites, J PHYS CH B, 103(17), 1999, pp. 3332-3336
Authors:
Collins, C
Mann, G
Hoppe, E
Duggal, T
Barr, TL
Klinowski, J
Citation: C. Collins et al., NMR and ESCA studies of the "silica garden" Bronsted acid catalyst, PCCP PHYS C, 1(15), 1999, pp. 3685-3687
Authors:
Benko, E
Stanislaw, JS
Krolicka, B
Wyczesany, A
Barr, TL
Citation: E. Benko et al., cBN-TiN, cBN-TiC composites: chemical equilibria, microstructure and hardness mechanical investigations, DIAM RELAT, 8(10), 1999, pp. 1838-1846
Authors:
Bruckner, JJ
Wozniak, K
Hardcastle, S
Sklyarov, A
Seal, S
Barr, TL
Citation: Jj. Bruckner et al., Cryogenic stabilization of high vapor pressure samples for surface analysis under ultrahigh vacuum conditions, J VAC SCI A, 17(5), 1999, pp. 2668-2675
Authors:
Barr, TL
Hoppe, EE
Hardcastle, S
Seal, S
Citation: Tl. Barr et al., X-ray photoelectron spectroscopy investigations of the chemistries of soils, J VAC SCI A, 17(4), 1999, pp. 1079-1085
Authors:
Barr, TL
Hoppe, E
Dugall, T
Shah, P
Seal, S
Citation: Tl. Barr et al., XPS and bonding: when and why can relaxation effects be ignored, J ELEC SPEC, 99, 1999, pp. 95-103
Authors:
Auciello, O
Krauss, AR
Gruen, DM
Shah, P
Corrigan, T
Kordesch, ME
Chang, RPH
Barr, TL
Citation: O. Auciello et al., Demonstration of Li-based alloy coatings as low-voltage stable electron-emission surfaces for field-emission devices, J APPL PHYS, 85(12), 1999, pp. 8405-8409
Authors:
Klinowski, J
Barr, TL
Citation: J. Klinowski et Tl. Barr, NMR and ESCA chemical shifts in aluminosilicates: A critical discussion, ACC CHEM RE, 32(8), 1999, pp. 633-640
Authors:
Seal, S
Barr, TL
Sobczak, N
Kerber, SJ
Citation: S. Seal et al., Microscopy and electron spectroscopic study of the interfacial chemistry in Al-Ti alloy/graphite systems, J MATER SCI, 33(16), 1998, pp. 4147-4158
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