Authors:
Rezazadeh, AA
Bashar, SA
Sheng, H
Amin, FA
Khalid, AH
Sotoodeh, M
Crouch, MA
Cattani, L
Fantini, F
Liou, JJ
Citation: Aa. Rezazadeh et al., Reliability investigation of InGaP/GaAs HBTs under current and temperaturestress, MICROEL REL, 39(12), 1999, pp. 1809-1816