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Results:
1-7
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Results: 7
Authors:
Basnar, B
Golka, S
Gornik, E
Harasek, S
Bertagnolli, E
Schatzmayr, M
Smoliner, J
Citation: B. Basnar et al., Calibrated scanning capacitance microscopy investigations on p-doped Si multilayers, J VAC SCI B, 19(5), 2001, pp. 1808-1812
Authors:
Basnar, B
Friedbacher, G
Brunner, H
Vallant, T
Mayer, U
Hoffmann, H
Citation: B. Basnar et al., Analytical evaluation of tapping mode atomic force microscopy for chemicalimaging of surfaces, APPL SURF S, 171(3-4), 2001, pp. 213-225
Authors:
Leicht, M
Fritzer, G
Basnar, B
Golka, S
Smoliner, J
Citation: M. Leicht et al., A reliable course of scanning capacitance microscopy analysis applied for 2D-dopant profilings of power MOSFET devices, MICROEL REL, 41(9-10), 2001, pp. 1535-1537
Authors:
Smoliner, J
Basnar, B
Golka, S
Gornik, E
Loffler, B
Schatzmayr, M
Enichlmair, H
Citation: J. Smoliner et al., Mechanism of bias-dependent contrast in scanning-capacitance-microscopy images, APPL PHYS L, 79(19), 2001, pp. 3182-3184
Authors:
Basnar, B
Schnoller, J
Fottinger, K
Friedbacher, G
Mayer, U
Hoffmann, H
Fabry, L
Citation: B. Basnar et al., Characterization of silicon wafers through deposition of self-assembled monolayers, FRESEN J AN, 368(5), 2000, pp. 434-438
Authors:
Basnar, B
Madera, M
Friedbacher, G
Vallant, T
Mayer, U
Hoffmann, H
Citation: B. Basnar et al., Fabrication of nanostructured surfaces using self-assembled monolayers, MIKROCH ACT, 133(1-4), 2000, pp. 325-329
Authors:
Brunner, H
Vallant, T
Mayer, U
Hoffmann, H
Basnar, B
Vallant, M
Friedbacher, G
Citation: H. Brunner et al., Substrate effects on the formation of alkylsiloxane monolayers, LANGMUIR, 15(6), 1999, pp. 1899-1901
Risultati:
1-7
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