Authors: Batchelor, DR Follath, R Schmeisser, D

Citation: Dr. Batchelor et al., Commissioning results of the BTUC-PGM beamline, NUCL INST A, 467, 2001, pp. 470-473

Authors: Hoffmann, P Mikalo, RP Yfantis, A Batchelor, DR Appel, G Yfantis, D Schmeisser, D

Citation: P. Hoffmann et al., A spectre-microscopic approach for thin film analysis: Grain boundaries inmc-Si and Sn/SnO2 nano particles, MIKROCH ACT, 136(3-4), 2001, pp. 109-113

Authors: Sieber, N Mantel, BF Seyller, T Ristein, J Ley, L Heller, T Batchelor, DR Schmeisser, D

Citation: N. Sieber et al., Electronic and chemical passivation of hexagonal 6H-SiC surfaces by hydrogen termination, APPL PHYS L, 78(9), 2001, pp. 1216-1218

Authors: Mikalo, RP Hoffmann, P Heller, T Batchelor, DR Appel, G Schmeisser, D

Citation: Rp. Mikalo et al., Doping and defect inhomogeneities of polypyrrole tosylate films as revealed by mu-NEXAFS, MAT SCI E C, 8-9, 1999, pp. 257-265

Authors: Schmeisser, D Bohme, O Yfantis, A Heller, T Batchelor, DR Lundstrom, I Spetz, AL

Citation: D. Schmeisser et al., Dipole moment of nanoparticles at interfaces, PHYS REV L, 83(2), 1999, pp. 380-383