Authors:
Murti, MR
Laskar, J
Nuttinck, S
Yoo, S
Raghavan, A
Bergman, JI
Bautista, J
Lai, R
Grundbacher, R
Barsky, M
Chin, P
Liu, PH
Citation: Mr. Murti et al., Temperature-dependent small-signal and noise parameter measurements and modeling on InPHEMTs, IEEE MICR T, 48(12), 2000, pp. 2579-2587