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Citation: Hc. Tsai et al., On improving test quality of scan-based BIST, IEEE COMP A, 19(8), 2000, pp. 928-938

Authors: Ghosh, I Jha, NK Bhawmik, S

Citation: I. Ghosh et al., A BIST scheme for RTL circuits based on symbolic testability analysis, IEEE COMP A, 19(1), 2000, pp. 111-128