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Results: 2
On improving test quality of scan-based BIST
Authors:
Tsai, HC Cheng, KT Bhawmik, S
Citation:
Hc. Tsai et al., On improving test quality of scan-based BIST, IEEE COMP A, 19(8), 2000, pp. 928-938
A BIST scheme for RTL circuits based on symbolic testability analysis
Authors:
Ghosh, I Jha, NK Bhawmik, S
Citation:
I. Ghosh et al., A BIST scheme for RTL circuits based on symbolic testability analysis, IEEE COMP A, 19(1), 2000, pp. 111-128
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