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Results:
1-10
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Results: 10
Authors:
Durand, O
Berger, V
Bisaro, R
Bouchier, A
De Rossi, A
Marcadet, X
Prevot, I
Citation: O. Durand et al., Determination of thicknesses and interface roughnesses of GaAs-based and InAs/AlSb-based heterostructures by X-ray reflectometry, MAT SC S PR, 4(1-3), 2001, pp. 327-330
Authors:
Prevot, I
Marcadet, X
Durand, O
Bisaro, R
Julien, FH
Citation: I. Prevot et al., Optical and structural investigation of InAs/AlSb/GaSb heterostructures, OPT MATER, 17(1-2), 2001, pp. 193-195
Authors:
Martin, P
Landesman, JP
Bisaro, R
Martin, E
Fily, A
Hirtz, JP
Citation: P. Martin et al., Packaging-induced stress distribution in high power AlGaAs laser diodes byphotoluminescence mapping, MAT SCI E B, 80(1-3), 2001, pp. 188-192
Authors:
Stellmacher, M
Bisaro, R
Galtier, P
Nagle, J
Khirouni, K
Bourgoin, JC
Citation: M. Stellmacher et al., Defects and defect behaviour in GaAs grown at low temperature, SEMIC SCI T, 16(6), 2001, pp. 440-446
Authors:
Prevot, I
Marcadet, X
Durand, O
Bisaro, R
Bouchier, A
Julien, FH
Citation: I. Prevot et al., Characterisation and optimisation of MBE grown arsenide/antimonide interfaces, J CRYST GR, 227, 2001, pp. 566-570
Authors:
Durand, O
Olivier, J
Bisaro, R
Galtier, P
Kruger, JK
Citation: O. Durand et al., X-ray diffraction analysis of the residual stresses in self-supported CVD diamond films, J PHYS IV, 10(P10), 2000, pp. 171-183
Authors:
Puech, P
Toufella, M
Carles, R
Sirvin, R
Bedel, E
Fontaine, C
Stellmacher, M
Bisaro, R
Nagle, J
Claverie, A
Benassayag, G
Citation: P. Puech et al., Non-stoichiometry in (001) low temperature GaAs by Raman spectroscopy, J PHYS-COND, 12(13), 2000, pp. 2895-2902
Authors:
Durand, O
Bisaro, R
Brierley, CJ
Galtier, P
Kennedy, GR
Kruger, JK
Olivier, J
Citation: O. Durand et al., Residual stresses in chemical vapor deposition free-standing diamond filmsby X-ray diffraction analyses, MAT SCI E A, 288(2), 2000, pp. 217-222
Authors:
Kappers, M
Guyaux, JL
Olivier, J
Bisaro, R
Grattepain, C
Garcia, JC
Citation: M. Kappers et al., Chemical beam epitaxy of GaN on (0001) sapphire substrate, MAT SCI E B, 59(1-3), 1999, pp. 52-55
Authors:
Durand, O
Olivier, J
Bisaro, R
Galtier, P
Kruger, JK
Brierley, CJ
Kennedy, GR
Citation: O. Durand et al., Macroscopic residual stress in chemical-vapor-deposition free-standing diamond films by x-ray diffraction analyses, APPL PHYS L, 75(13), 1999, pp. 1881-1883
Risultati:
1-10
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