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Results:
1-7
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Results: 7
Authors:
Kueppers, H
Hoffmann, M
Leuerer, T
Schneller, T
Boettger, U
Waser, R
Mokwa, W
Schnakenberg, U
Citation: H. Kueppers et al., Basic investigations on a piezoelectric bending actuator for micro-electro-mechanical applications, INTEGR FERR, 35(1-4), 2001, pp. 1999-2011
Authors:
Lohse, O
Grossmann, M
Bolten, D
Boettger, U
Waser, R
Citation: O. Lohse et al., Relaxation mechanisms in ferroelectric thin film capacitors for FeRAM application, INTEGR FERR, 33(1-4), 2001, pp. 39-48
Authors:
Grossmann, M
Lohse, O
Bolten, D
Boettger, U
Waser, R
Tiedke, S
Schmitz, T
Kall, U
Kastner, M
Schindler, G
Hartner, W
Citation: M. Grossmann et al., Influence of the measurement parameters on the reliability of ferroelectric thin films, INTEGR FERR, 32(1-4), 2001, pp. 693-701
Authors:
Lohse, O
Grossmann, M
Boettger, U
Bolten, D
Waser, R
Citation: O. Lohse et al., Relaxation mechanism of ferroelectric switching in Pb(Zr,Ti)O-3 thin films, J APPL PHYS, 89(4), 2001, pp. 2332-2336
Authors:
Weber, U
Greuel, G
Boettger, U
Weber, S
Hennings, D
Waser, R
Citation: U. Weber et al., Dielectric properties of Ba(Zr,Ti)O-3-based ferroelectrics for capacitor applications, J AM CERAM, 84(4), 2001, pp. 759-766
Authors:
Grossmann, M
Bolten, D
Lohse, O
Boettger, U
Waser, R
Tiedke, S
Citation: M. Grossmann et al., Correlation between switching and fatigue in PbZr0.3Ti0.7O3 thin films, APPL PHYS L, 77(12), 2000, pp. 1894-1896
Authors:
Grossmann, M
Lohse, O
Bolten, D
Boettger, U
Waser, R
Hartner, W
Kastner, M
Schindler, G
Citation: M. Grossmann et al., Lifetime estimation due to imprint failure in ferroelectric SrBi2Ta2O9 thin films, APPL PHYS L, 76(3), 2000, pp. 363-365
Risultati:
1-7
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