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Results: 1-14 |
Results: 14

Authors: Boggs, S Krinsley, DH Goles, GG Seyedolali, A Dypvik, H
Citation: S. Boggs et al., Identification of shocked quartz by scanning cathodoluminescence imaging, METEORIT PL, 36(6), 2001, pp. 783-791

Authors: Kuang, JB Boggs, S
Citation: Jb. Kuang et S. Boggs, Computation of thermo-chemical phenomena related to high temperature HPFF cable operation, IEEE POW D, 16(4), 2001, pp. 449-455

Authors: Boggs, S Damon, DH Hjerrild, J Holboll, JT Henriksen, M
Citation: S. Boggs et al., Effect of insulation properties on the field grading of solid dielectric DC cable, IEEE POW D, 16(4), 2001, pp. 456-461

Authors: Boggs, S Andoh, H
Citation: S. Boggs et H. Andoh, A statistical approach to prediction of ZnO arrester element characteristics, IEEE POW D, 16(4), 2001, pp. 604-610

Authors: Boggs, S
Citation: S. Boggs, Untitled, IEEE ELEC I, 17(3), 2001, pp. 7-7

Authors: Boggs, S Xu, J
Citation: S. Boggs et J. Xu, Water treeing - Filled versus unfilled cable insulation, IEEE ELEC I, 17(1), 2001, pp. 23-29

Authors: Cao, Y Boggs, S
Citation: Y. Cao et S. Boggs, Measurement and computation of thermally-induced currents in coaxial signal cables, IEEE DIELEC, 7(2), 2000, pp. 208-215

Authors: Zhou, LM Boggs, S
Citation: Lm. Zhou et S. Boggs, Effect of shielded distribution cable on very fast transients, IEEE POW D, 15(3), 2000, pp. 857-863

Authors: Boggs, S Kuang, J Andoh, H Nishiwaki, S
Citation: S. Boggs et al., Increased energy absorption in ZnO arrester elements through control of electrode edge margin, IEEE POW D, 15(2), 2000, pp. 562-568

Authors: Boggs, S Kuang, JB Andoh, H Nishiwaki, S
Citation: S. Boggs et al., Electro-thermal-mechanical computations in ZnO arrester elements, IEEE POW D, 15(1), 2000, pp. 128-134

Authors: Boggs, S
Citation: S. Boggs, Untitled - Steven Boggs' reply, IEEE ELEC I, 16(6), 2000, pp. 5-5

Authors: Boggs, S Densley, J
Citation: S. Boggs et J. Densley, Fundamentals of partial discharge in the context of field cable testing, IEEE ELEC I, 16(5), 2000, pp. 13-18

Authors: Andoh, H Nishiwaki, S Suzuki, H Boggs, S Kuang, J
Citation: H. Andoh et al., Failure mechanisms and recent improvements in ZnO arrester elements, IEEE ELEC I, 16(1), 2000, pp. 25-31

Authors: Boggs, S Huang, LX Stuehr, DJ
Citation: S. Boggs et al., Formation and reactions of the heme-dioxygen intermediate in the first andsecond steps of nitric oxide synthesis as studied by stopped-flow spectroscopy under single-turnover conditions, BIOCHEM, 39(9), 2000, pp. 2332-2339
Risultati: 1-14 |