AAAAAA
Results: 26-32/32
Authors:
Botta, C
Destri, S
Porzio, W
Borghesi, A
Sassella, A
Tubino, R
Bongiovanni, G
Loi, MA
Mura, A
Citation: C. Botta et al., Photoexcitations in oriented tetrahexyl-sexithiophene thin films, PHYS REV B, 60(8), 1999, pp. 6039-6044
Authors:
Callard, S
Tallarida, G
Borghesi, A
Zanotti, L
Citation: S. Callard et al., Thermal conductivity of SiO2 films by scanning thermal microscopy, J NON-CRYST, 245, 1999, pp. 203-209
Authors:
Sassella, A
Borghesi, A
Pinotti, E
Tubino, R
Destri, S
Porzio, W
Citation: A. Sassella et al., Molecular beam deposition of thin films of organic semiconductors, J CRYST GR, 202, 1999, pp. 1044-1048
Authors:
Pivac, B
Furic, K
Desnica, D
Borghesi, A
Sassella, A
Citation: B. Pivac et al., Raman line profile in polycrystalline silicon, J APPL PHYS, 86(8), 1999, pp. 4383-4386
Authors:
Sassella, A
Borghesi, A
Geranzani, P
Borionetti, G
Citation: A. Sassella et al., Infrared response of oxygen precipitates in silicon: Experimental and simulated spectra, APPL PHYS L, 75(8), 1999, pp. 1131-1133
Authors:
Meinardi, F
Quilici, S
Borghesi, A
Artioli, G
Citation: F. Meinardi et al., Microstructure imaging of C54-TiSi2 polycrystalline thin films by micro-Raman spectroscopy, APPL PHYS L, 75(20), 1999, pp. 3090-3092
Authors:
Sassella, A
Borghesi, A
Tubino, R
Destri, S
Porzio, W
Citation: A. Sassella et al., Orientation and order of beta-tetrahexyl-sexithiophene molecules depositedby organic molecular beam deposition, SYNTH METAL, 98(2), 1998, pp. 83-86