Authors: Sims, JS Hagedorn, JG Ketcham, PM Satterfield, SG Griffin, TJ George, WL Fowler, HA am Ende, BA Hung, HK Bohn, RB Koontz, JE Martys, NS Bouldin, CE Warren, JA Feder, DL Clark, CW Filla, BJ Devaney, JE

Citation: Js. Sims et al., Accelerating scientific discovery through computation and visualization, J RES NAT I, 105(6), 2000, pp. 875-894

Authors: Bouldin, CE Wallace, WE Lynn, GW Roth, SC Wu, WL

Citation: Ce. Bouldin et al., Thermal expansion coefficients of low-k dielectric films from Fourier analysis of x-ray reflectivity, J APPL PHYS, 88(2), 2000, pp. 691-695

Authors: Ravel, B Bouldin, CE Renevler, H Hodeau, JL Berar, JF

Citation: B. Ravel et al., Edge separation using diffraction anomalous fine structure, J SYNCHROTR, 6, 1999, pp. 338-340

Authors: Ravel, B Bouldin, CE Renevier, H Hodeau, JL Berar, JF

Citation: B. Ravel et al., X-ray-absorption edge separation using diffraction anomalous fine structure, PHYS REV B, 60(2), 1999, pp. 778-785