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Results: 1-9 |
Results: 9
Carbon films for use as the electron source in a parallel e-beam lithography system
Authors: Milne, WI Teo, KBK Chhowalla, M Amaratunga, GAJ Yuan, J Robertson, J Legagneux, P Pirio, G Pribat, D Bouzehouane, K Bruenger, W Trautmann, C
Citation: Wi. Milne et al., Carbon films for use as the electron source in a parallel e-beam lithography system, NEW DIAM FR, 11(4), 2001, pp. 235-247
Frequency agile microwave devices based on Y-Ba-Cu-O/Sr-Ti-O//La-Al-O structure
Authors: Marcilhac, B Crete, DG Lemaitre, Y Mansart, D Mage, JC Bouzehouane, K Dolin, C Jacquet, E Woodall, P Contour, JP
Citation: B. Marcilhac et al., Frequency agile microwave devices based on Y-Ba-Cu-O/Sr-Ti-O//La-Al-O structure, IEEE APPL S, 11(1), 2001, pp. 438-441
Epitaxial YBa2Cu3O7-delta/SrTiO3 heterostructures grown on LaAlO3 substrate by pulsed laser deposition for voltage tunable microwave filter applications
Authors: Woodall, P Bouzehouane, K Marcilhac, B Crete, DG Jacquet, E Mage, JC Contour, JP
Citation: P. Woodall et al., Epitaxial YBa2Cu3O7-delta/SrTiO3 heterostructures grown on LaAlO3 substrate by pulsed laser deposition for voltage tunable microwave filter applications, IEEE APPL S, 11(1), 2001, pp. 1150-1153
XRD and TEM characterization of cuprate thin films epitaxially grown on SrTiO3 (001) vicinal surfaces
Authors: Maurice, JL Durand, O Bouzehouane, K Contour, JP
Citation: Jl. Maurice et al., XRD and TEM characterization of cuprate thin films epitaxially grown on SrTiO3 (001) vicinal surfaces, PHYSICA C, 351(1), 2001, pp. 5-8
Relative pinning strength of twin boundaries and outgrowths in YBa2Cu3O7 thin films and superlattices - art. no. 144506
Authors: Berger, S Crete, DG Contour, JP Bouzehouane, K Maurice, JL Durand, O
Citation: S. Berger et al., Relative pinning strength of twin boundaries and outgrowths in YBa2Cu3O7 thin films and superlattices - art. no. 144506, PHYS REV B, 6314(14), 2001, pp. 4506
Conducting tip atomic force microscopy analysis of aluminum oxide barrier defects decorated by electrodeposition
Authors: Carrey, J Bouzehouane, K George, JM Ceneray, C Fert, A Vaures, A Kenane, S Piraux, L
Citation: J. Carrey et al., Conducting tip atomic force microscopy analysis of aluminum oxide barrier defects decorated by electrodeposition, APPL PHYS L, 79(19), 2001, pp. 3158-3160
Optical characterization and room temperature lifetime measurements of high quality MBE-grown InAsSb on GaSb
Authors: Rakovska, A Berger, V Marcadet, X Vinter, B Bouzehouane, K Kaplan, D
Citation: A. Rakovska et al., Optical characterization and room temperature lifetime measurements of high quality MBE-grown InAsSb on GaSb, SEMIC SCI T, 15(1), 2000, pp. 34-39
Realization of a flux-flow DC-transformer using high temperature superconductors
Authors: Berger, S Bouzehouane, K Crete, D Contour, JP
Citation: S. Berger et al., Realization of a flux-flow DC-transformer using high temperature superconductors, EPJ-APPL PH, 6(2), 1999, pp. 111-113
Pulsed laser ablation for synthesis of superconductor films at high critical temperature
Authors: Bouzehouane, K Contour, JP
Citation: K. Bouzehouane et Jp. Contour, Pulsed laser ablation for synthesis of superconductor films at high critical temperature, VIDE, 54(287), 1998, pp. 303-330
Risultati: 1-9 |