Authors: Brechbuhl, J Bauch, J Ullrich, HJ

Citation: J. Brechbuhl et al., Measurements of residual stresses in micron regions by using synchrotron excited Kossel diffraction, CRYST RES T, 34(1), 1999, pp. 59-70

Authors: Bauch, J Brechbuhl, J Ullrich, HJ Meinl, G Lin, H Kebede, W

Citation: J. Bauch et al., Innovative analysis of X-ray microdiffraction images on selected applications of the Kossel technique, CRYST RES T, 34(1), 1999, pp. 71-88