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Results: 2

Authors: Brodbeck, T Kagerer, A
Citation: T. Brodbeck et A. Kagerer, Influence of the device package on the results of charged device model (CDM) tests - consequences for tester characterization and test procedure, J ELECTROST, 47(4), 1999, pp. 277-289

Authors: Chaine, M Verhaege, K Avery, L Kelly, M Gieser, H Bock, K Henry, LG Meuse, T Brodbeck, T Barth, J
Citation: M. Chaine et al., Investigation into socketed CDM (SDM) tester parasitics, MICROEL REL, 39(11), 1999, pp. 1531-1540
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