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Results:
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Results: 2
Influence of the device package on the results of charged device model (CDM) tests - consequences for tester characterization and test procedure
Authors:
Brodbeck, T Kagerer, A
Citation:
T. Brodbeck et A. Kagerer, Influence of the device package on the results of charged device model (CDM) tests - consequences for tester characterization and test procedure, J ELECTROST, 47(4), 1999, pp. 277-289
Investigation into socketed CDM (SDM) tester parasitics
Authors:
Chaine, M Verhaege, K Avery, L Kelly, M Gieser, H Bock, K Henry, LG Meuse, T Brodbeck, T Barth, J
Citation:
M. Chaine et al., Investigation into socketed CDM (SDM) tester parasitics, MICROEL REL, 39(11), 1999, pp. 1531-1540
Risultati:
1-2
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