AAAAAA
Results: 1-25/27
Authors:
Bruggemann, R
Pudenz, S
Carlsen, L
Sorensen, PB
Thomsen, M
Mishra, RK
Citation: R. Bruggemann et al., The use of Hasse diagrams as a potential approach for inverse QSAR, SAR QSAR EN, 11(5-6), 2001, pp. 473-487
Authors:
Niikura, C
Brenot, R
Guillet, J
Bouree, JE
Kleider, JP
Bruggemann, R
Longeaud, C
Citation: C. Niikura et al., Microcrystalline silicon films deposited by hot-wire CVD for solar cells on low-temperature substrate, SOL EN MAT, 66(1-4), 2001, pp. 421-429
Authors:
Bruggemann, R
Halfon, E
Welzl, G
Voigt, K
Steinberg, CEW
Citation: R. Bruggemann et al., Applying the concept of partially ordered sets on the ranking of near-shore sediments by a battery of tests, J CHEM INF, 41(4), 2001, pp. 918-925
Authors:
Kleider, JP
Longeaud, C
Bruggemann, R
Houze, F
Citation: Jp. Kleider et al., Electronic and topographic properties of amorphous and microcrystalline silicon thin films, THIN SOL FI, 383(1-2), 2001, pp. 57-60
Authors:
Bruggemann, R
Bronner, W
Mehring, M
Citation: R. Bruggemann et al., Influence of electron irradiation on the electronic properties of microcrystalline silicon, SOL ST COMM, 119(1), 2001, pp. 23-27
Authors:
Steinberg, CEW
Haitzer, M
Bruggemann, R
Perminova, IV
Yashchenko, NY
Petrosyan, VS
Citation: Cew. Steinberg et al., Towards a quantitative structure activity relationship (QSAR) of dissolvedhumic substances as detoxifying agents in freshwaters, INT REV HYD, 85(2-3), 2000, pp. 253-266
Authors:
Guillet, J
Niikura, C
Bouree, JE
Kleider, JP
Longeaud, C
Bruggemann, R
Citation: J. Guillet et al., Microcrystalline silicon deposited by the hot-wire CVD technique, MAT SCI E B, 69, 2000, pp. 284-288
Authors:
Wilhelm, T
Bruggemann, R
Citation: T. Wilhelm et R. Bruggemann, Goal functions for the development of natural systems, ECOL MODEL, 132(3), 2000, pp. 231-246
Authors:
Voigt, K
Gasteiger, J
Bruggemann, R
Citation: K. Voigt et al., Comparative evaluation of chemical and environmental online and CD-ROM databases, J CHEM INF, 40(1), 2000, pp. 44-49
Authors:
Pudenz, S
Bruggemann, R
Luther, B
Kaune, A
Kreimes, K
Citation: S. Pudenz et al., An algebraic/graphical tool to compare ecosystems with respect to their pollution V: cluster analysis and Hasse diagrams, CHEMOSPHERE, 40(12), 2000, pp. 1373-1382
Authors:
Hupfer, M
Pothig, R
Bruggemann, R
Geller, W
Citation: M. Hupfer et al., Mechanical resuspension of autochthonous calcite (Seekreide) failed to control internal phosphorus cycle in a eutrophic lake, WATER RES, 34(3), 2000, pp. 859-867
Authors:
Bruggemann, R
Kleider, JP
Longeaud, C
Mencaraglia, D
Guillet, J
Bouree, JE
Niikura, C
Citation: R. Bruggemann et al., Electronic properties of silicon thin films prepared by hot-wire chemical vapour deposition, J NON-CRYST, 266, 2000, pp. 258-262
Authors:
Unold, T
Bruggemann, R
Kleider, JP
Longeaud, C
Citation: T. Unold et al., Anisotropy in the transport of microcrystalline silicon, J NON-CRYST, 266, 2000, pp. 325-330
Authors:
Bronner, W
Bruggemann, R
Mehring, M
Citation: W. Bronner et al., Standard and electrically detected magnetic resonance in nanocrystalline silicon, J NON-CRYST, 266, 2000, pp. 534-539
Authors:
Terukov, EI
Konkov, OI
Kudoyarova, VK
Koughia, KV
Weiser, G
Kuhne, H
Kleider, JP
Longeaud, C
Bruggemann, R
Citation: Ei. Terukov et al., Erbium incorporation in plasma-deposited amorphous silicon, J NON-CRYST, 266, 2000, pp. 614-618
Authors:
Bruggemann, R
Rosch, M
Meyer, J
Citation: R. Bruggemann et al., Apparent quantum efficiencies greater than unity from lateral photocurrents, SOL EN MAT, 57(3), 1999, pp. 303-311
Authors:
Bruggemann, R
Bronner, W
Citation: R. Bruggemann et W. Bronner, Field-enhanced low-temperature photoconductivity in nanocrystalline silicon, PHYS ST S-B, 212(2), 1999, pp. R15-R16
Authors:
Bruggemann, R
Bucherl, C
Pudenz, S
Steinberg, CEW
Citation: R. Bruggemann et al., Application of the concept of partial order on comparative evaluation of environmental chemicals, ACT HYDR HY, 27(3), 1999, pp. 170-178
Authors:
Bruggemann, R
Bartel, HG
Citation: R. Bruggemann et Hg. Bartel, A theoretical concept to rank environmentally significant chemicals, J CHEM INF, 39(2), 1999, pp. 211-217
Authors:
Geyer, HJ
Kaune, A
Schramm, KW
Rimkus, G
Scheunert, I
Bruggemann, R
Altschuh, J
Steinberg, CE
Vetter, W
Kettrup, A
Muir, DCG
Citation: Hj. Geyer et al., Predicting bioconcentration factors (BCFs) of polychlorinated bornane (Toxaphene) congeners in fish and comparison with bioaccumulation factors (BAFs) in biota from the aquatic environment, CHEMOSPHERE, 39(4), 1999, pp. 655-663
Authors:
Altschuh, J
Bruggemann, R
Santl, H
Eichinger, G
Piringer, OG
Citation: J. Altschuh et al., Henry's law constants for a diverse set of organic chemicals: Experimentaldetermination and comparison of estimation methods, CHEMOSPHERE, 39(11), 1999, pp. 1871-1887
Authors:
Bruggemann, R
Pudenz, S
Voigt, K
Kaune, A
Kreimes, K
Citation: R. Bruggemann et al., An algebraic/graphical tool to compare ecosystems with respect to their pollution IV: Comparative regional analysis by Boolean arithmetics, CHEMOSPHERE, 38(10), 1999, pp. 2263-2279
Authors:
Main, C
Zollondz, JH
Reynolds, S
Gao, W
Bruggemann, R
Rose, MJ
Citation: C. Main et al., Investigation of collection efficiencies much larger than unity in a-Si : H p-i-n structures, J APPL PHYS, 85(1), 1999, pp. 296-301
Authors:
Taylor, P
Wong, L
Radic, Z
Tsigelny, I
Bruggemann, R
Hosea, NA
Berman, HA
Citation: P. Taylor et al., Analysis of cholinesterase inactivation and reactivation by systematic structural modification and enantiomeric selectivity, CHEM-BIO IN, 120, 1999, pp. 3-15
Authors:
Wehrspohn, RB
Deane, SC
French, ID
Gale, IG
Powell, MJ
Bruggemann, R
Citation: Rb. Wehrspohn et al., Urbach energy dependence of the stability in amorphous silicon thin-film transistors, APPL PHYS L, 74(22), 1999, pp. 3374-3376