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Results: 1-7 |
Results: 7

Authors: Brunthaler, G Prinz, A Bauer, G Pudalov, VM
Citation: G. Brunthaler et al., Exclusion of quantum coherence as the origin of the 2D metallic state in high-mobility silicon inversion layers - art. no. 096802, PHYS REV L, 8709(9), 2001, pp. 6802

Authors: Prinz, A Pudalov, VM Brunthaler, G Bauer, G
Citation: A. Prinz et al., Metal-insulator transition in Si-MOS structures, SUPERLATT M, 27(5-6), 2000, pp. 301-310

Authors: Brunthaler, G Prinz, A Bauer, G Pudalov, VM Dizhur, EM Jaroszynski, J Glod, P Dietl, T
Citation: G. Brunthaler et al., Weak localization in the 2D metallic regime of Si-MOS, ANN PHYSIK, 8(7-9), 1999, pp. 579-584

Authors: Pudalov, VM Brunthaler, G Prinz, A Bauer, G
Citation: Vm. Pudalov et al., Maximum metallic conductivity in Si-MOS structures, PHYS REV B, 60(4), 1999, pp. R2154-R2156

Authors: Herz, K Bacher, G Forchel, A Straub, H Brunthaler, G Faschinger, W Bauer, G Vieu, C
Citation: K. Herz et al., Recombination dynamics in dry-etched (Cd,Zn)Se/ZnSe nanostructures: Influence of exciton localization, PHYS REV B, 59(4), 1999, pp. 2888-2893

Authors: Prinz, A Brunthaler, G Ueta, Y Springholz, G Bauer, G Grabecki, G Dietl, T
Citation: A. Prinz et al., Electron localization in n-Pb1-xEuxTe, PHYS REV B, 59(20), 1999, pp. 12983-12990

Authors: Pudalov, VM Brunthaler, G Prinz, A Bauer, G
Citation: Vm. Pudalov et al., Weak-field Hall resistance and effective carrier density measurements across the metal-insulator transition in Si-MOS structures, JETP LETTER, 70(1), 1999, pp. 48-53
Risultati: 1-7 |