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Results: 1-9 |
Results: 9
SHELL-WISE OXIDATION OF NANOCRYSTALLINE SILICON OBSERVED BY X-RAY-DIFFRACTION AND TEM
Authors: VOGEL W BOTTI S MARTELLI S CARLINO E
Citation: W. Vogel et al., SHELL-WISE OXIDATION OF NANOCRYSTALLINE SILICON OBSERVED BY X-RAY-DIFFRACTION AND TEM, New journal of chemistry, 22(7), 1998, pp. 749-752
STRUCTURE AND CHEMISTRY OF AG-CU NANOCLUSTERS IN A SILICA MATRIX BY THE SOL-GEL PROCESS
Authors: CATALANO M CARLINO E DE G TAPFER L GONELLA F MAZZOLDI P BATTAGLIN G
Citation: M. Catalano et al., STRUCTURE AND CHEMISTRY OF AG-CU NANOCLUSTERS IN A SILICA MATRIX BY THE SOL-GEL PROCESS, Philosophical magazine. B. Physics of condensed matter. Statistical mechanics, electronic, optical and magnetic, 76(4), 1997, pp. 621-628
EFFECTS OF THE ELASTIC STRESS-RELAXATION ON THE HRTEM IMAGE-CONTRAST OF STRAINED HETEROSTRUCTURES
Authors: DECARO L GIUFFRIDA A CARLINO E TAPFER L
Citation: L. Decaro et al., EFFECTS OF THE ELASTIC STRESS-RELAXATION ON THE HRTEM IMAGE-CONTRAST OF STRAINED HETEROSTRUCTURES, Acta crystallographica. Section A, Foundations of crystallography, 53, 1997, pp. 168-174
STRAIN RELAXATION OF SI GE MULTILAYERS - COHERENT ISLANDS FORMATION AND THEIR EVOLUTION AS A FUNCTION OF THE STRAIN/
Authors: CARLINO E GIANNINI C GERARDI C TAPFER L MADER KA VONKANEL H
Citation: E. Carlino et al., STRAIN RELAXATION OF SI GE MULTILAYERS - COHERENT ISLANDS FORMATION AND THEIR EVOLUTION AS A FUNCTION OF THE STRAIN/, Journal of applied physics, 79(3), 1996, pp. 1441-1447
COHERENT ISLANDS AS PREFERENTIAL SITES FOR STICKING OF GE ATOMS IN SIGE MULTILAYERS - FORMATION OF CONICAL SHAPED DEFECTS/
Authors: CARLINO E TAPFER L VONKANEL H
Citation: E. Carlino et al., COHERENT ISLANDS AS PREFERENTIAL SITES FOR STICKING OF GE ATOMS IN SIGE MULTILAYERS - FORMATION OF CONICAL SHAPED DEFECTS/, Applied physics letters, 69(17), 1996, pp. 2546-2548
ELASTIC STRESS-RELAXATION IN HRTEM SPECIMENS OF STRAINED SEMICONDUCTOR HETEROSTRUCTURES AND ITS INFLUENCE ON THE IMAGE-CONTRAST
Authors: DECARO L GIUFFRIDA A CARLINO E TAPFER L
Citation: L. Decaro et al., ELASTIC STRESS-RELAXATION IN HRTEM SPECIMENS OF STRAINED SEMICONDUCTOR HETEROSTRUCTURES AND ITS INFLUENCE ON THE IMAGE-CONTRAST, Microscopy microanalysis microstructures, 6(5-6), 1995, pp. 465-472
STRAIN RELAXATION OF SI GE MULTILAYERS INVESTIGATED BY TRANSMISSION ELECTRON-MICROSCOPY AND HIGH-RESOLUTION X-RAY-DIFFRACTOMETRY/
Authors: CARLINO E GIANNINI C TAPFER L MADER KA VONKANEL H
Citation: E. Carlino et al., STRAIN RELAXATION OF SI GE MULTILAYERS INVESTIGATED BY TRANSMISSION ELECTRON-MICROSCOPY AND HIGH-RESOLUTION X-RAY-DIFFRACTOMETRY/, Microscopy microanalysis microstructures, 6(5-6), 1995, pp. 473-482
MICROSTRUCTURAL AND MICROANALYTICAL CHARACTERIZATION OF PD CLUSTERS IN ORMOCER MATRIX
Authors: CATALANO M CARLINO E TAGLIENTE MA LICCIULLI A TAPFER L
Citation: M. Catalano et al., MICROSTRUCTURAL AND MICROANALYTICAL CHARACTERIZATION OF PD CLUSTERS IN ORMOCER MATRIX, Microscopy microanalysis microstructures, 6(5-6), 1995, pp. 611-619
STRUCTURAL CHARACTERIZATION OF LATTICE-MATCHED ALXIN1-XAS INP AND GAYIN1-YAS/INP HETEROSTRUCTURES BY TRANSMISSION ELECTRON-MICROSCOPY AND HIGH-RESOLUTION X-RAY-DIFFRACTION/
Authors: CARLINO E GIANNINI C TAPFER L CATALANO M TOURNIE E ZHANG YH PLOOG KH
Citation: E. Carlino et al., STRUCTURAL CHARACTERIZATION OF LATTICE-MATCHED ALXIN1-XAS INP AND GAYIN1-YAS/INP HETEROSTRUCTURES BY TRANSMISSION ELECTRON-MICROSCOPY AND HIGH-RESOLUTION X-RAY-DIFFRACTION/, Journal of applied physics, 78(4), 1995, pp. 2403-2410
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