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Results: 1-9 |
Results: 9
EFFECTS OF MATERIAL AND OR STRUCTURE ON SHIELDING OF ELECTRONIC DEVICES/
Authors: MANGERET R CARRIERE T BEAUCOUR J JORDAN TM
Citation: R. Mangeret et al., EFFECTS OF MATERIAL AND OR STRUCTURE ON SHIELDING OF ELECTRONIC DEVICES/, IEEE transactions on nuclear science, 43(6), 1996, pp. 2665-2670
PROTON SEU TEST OF MC68020, MC68882, TMS320C25 ON THE ARIANE5 LAUNCHER ON BOARD COMPUTER (OBC) AND INERTIAL REFERENCE SYSTEM (SRI)
Authors: POIVEY C NOTEBAERT O GARNIER P CARRIERE T BEAUCOUR J STEIGER B SALLE JM CALVET MC SIMON P
Citation: C. Poivey et al., PROTON SEU TEST OF MC68020, MC68882, TMS320C25 ON THE ARIANE5 LAUNCHER ON BOARD COMPUTER (OBC) AND INERTIAL REFERENCE SYSTEM (SRI), IEEE transactions on nuclear science, 43(3), 1996, pp. 886-892
DOSE-RATE AND ANNEALING EFFECTS ON TOTAL-DOSE RESPONSE OF MOS AND BIPOLAR CIRCUITS
Authors: CARRIERE T BEAUCOUR J GACH A JOHLANDER B ADAMS L
Citation: T. Carriere et al., DOSE-RATE AND ANNEALING EFFECTS ON TOTAL-DOSE RESPONSE OF MOS AND BIPOLAR CIRCUITS, IEEE transactions on nuclear science, 42(6), 1995, pp. 1567-1574
CHARACTERIZATION OF SINGLE HARD ERRORS (SHE) IN 1M-BIT SRAMS FROM SINGLE-ION
Authors: POIVEY C CARRIERE T BEAUCOUR J OLDHAM TR
Citation: C. Poivey et al., CHARACTERIZATION OF SINGLE HARD ERRORS (SHE) IN 1M-BIT SRAMS FROM SINGLE-ION, IEEE transactions on nuclear science, 41(6), 1994, pp. 2235-2239
TOTAL-DOSE EFFECTS ON NEGATIVE VOLTAGE REGULATOR
Authors: BEAUCOUR J CARRIERE T GACH A LAXAGUE D POIROT P
Citation: J. Beaucour et al., TOTAL-DOSE EFFECTS ON NEGATIVE VOLTAGE REGULATOR, IEEE transactions on nuclear science, 41(6), 1994, pp. 2420-2426
CHARACTERIZATION OF PROTON INTERACTIONS IN ELECTRONIC COMPONENTS
Authors: DOUCIN B PATIN Y LOCHARD JP BEAUCOUR J CARRIERE T ISABELLE D BUISSON J CORBIERE T BION T
Citation: B. Doucin et al., CHARACTERIZATION OF PROTON INTERACTIONS IN ELECTRONIC COMPONENTS, IEEE transactions on nuclear science, 41(3), 1994, pp. 593-598
ATRIAL SEPTAL ANEURYSM - A RETROSPECTIVE STUDY OF 41 CASES
Authors: DOUCHET MP VERDUN A CARRIERE T BRANDT CM ATTALI P FINCKER JL
Citation: Mp. Douchet et al., ATRIAL SEPTAL ANEURYSM - A RETROSPECTIVE STUDY OF 41 CASES, Archives des maladies du coeur et des vaisseaux, 87(4), 1994, pp. 451-457
THE EFFECTS OF BIAS CONDITIONS DURING IRRADIATION IN BIPOLAR COMPONENTS
Authors: DELL JM CARRIERE T SORIANO D BEAUCOUR J
Citation: Jm. Dell et al., THE EFFECTS OF BIAS CONDITIONS DURING IRRADIATION IN BIPOLAR COMPONENTS, Annales de chimie, 18(2), 1993, pp. 113-124
TOTAL-DOSE FAILURES IN ADVANCED ELECTRONICS FROM SINGLE IONS
Authors: OLDHAM TR BENNETT KW BEAUCOUR J CARRIERE T POLVEY C GARNIER P
Citation: Tr. Oldham et al., TOTAL-DOSE FAILURES IN ADVANCED ELECTRONICS FROM SINGLE IONS, IEEE transactions on nuclear science, 40(6), 1993, pp. 1820-1830
Risultati: 1-9 |