Citation: Ge. Carver et Rw. Heebner, WAFER LEVEL TESTING FOR SEMICONDUCTOR-LASER MANUFACTURE VIA SPATIALLY-RESOLVED PHOTOLUMINESCENCE, IEEE journal of selected topics in quantum electronics, 1(4), 1995, pp. 980-986
Authors:
RIBES AC
DAMASKINOS S
DIXON AE
CARVER GE
PENG C
FAUCHET PM
SHAM TK
COULTHARD I
Citation: Ac. Ribes et al., PHOTOLUMINESCENCE IMAGING OF POROUS SILICON USING A CONFOCAL SCANNINGLASER MACROSCOPE MICROSCOPE, Applied physics letters, 66(18), 1995, pp. 2321-2323
Authors:
CARVER GE
GRAY ML
LEVKOFF J
MILLER BW
PHATAK SB
Citation: Ge. Carver et al., NONDESTRUCTIVE OPTICAL TECHNIQUES FOR CHARACTERIZING SEMICONDUCTOR-MATERIALS AND DEVICES, AT&T technical journal, 73(2), 1994, pp. 66-76