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Results: 1-9 |
Results: 9
NEW OPTICAL PROBES USING INP-BASED CANTILEVERS
Authors: CASTAGNE M BELIER B GALL P BENFEDDA M SEASSAL C SPISSER A LECLERC JL VIKTOROVICH P
Citation: M. Castagne et al., NEW OPTICAL PROBES USING INP-BASED CANTILEVERS, Ultramicroscopy, 71(1-4), 1998, pp. 81-84
A STUDY OF SEMICONDUCTOR SURFACES AND DEVICES BY COUPLED IR PHOTON TUNNELING AND ATOMIC-FORCE MICROSCOPY
Authors: GALLBORRUT P CASTAGNE M WEYHER JL FILLARD JP BONNAFE J
Citation: P. Gallborrut et al., A STUDY OF SEMICONDUCTOR SURFACES AND DEVICES BY COUPLED IR PHOTON TUNNELING AND ATOMIC-FORCE MICROSCOPY, Ultramicroscopy, 71(1-4), 1998, pp. 231-234
VIRTUAL PHOTON SCATTERING AT SUBWAVELENGTH SIZED TIPS
Authors: FILLARD JP CASTAGNE M BENFEDDA M LAHIMER S DANZEBRINK HU
Citation: Jp. Fillard et al., VIRTUAL PHOTON SCATTERING AT SUBWAVELENGTH SIZED TIPS, Applied physics A: Materials science & processing, 63(5), 1996, pp. 421-425
A MODEL FOR THE MECHANISM OF FIELD INTERACTION AT SILICON AFM TIPS INPHOTON TUNNELING TRANSFER
Authors: FILLARD JP CASTAGNE M PRIOLEAU C BENFEDDA M BONNAFE J
Citation: Jp. Fillard et al., A MODEL FOR THE MECHANISM OF FIELD INTERACTION AT SILICON AFM TIPS INPHOTON TUNNELING TRANSFER, Ultramicroscopy, 61(1-4), 1995, pp. 85-89
OPTICAL-PROPERTIES OF SILICON-NITRIDE ATOMIC-FORCE-MICROSCOPY TIPS INSCANNING TUNNELING OPTICAL MICROSCOPY - EXPERIMENTAL-STUDY
Authors: CASTAGNE M PRIOLEAU C FILLARD JP
Citation: M. Castagne et al., OPTICAL-PROPERTIES OF SILICON-NITRIDE ATOMIC-FORCE-MICROSCOPY TIPS INSCANNING TUNNELING OPTICAL MICROSCOPY - EXPERIMENTAL-STUDY, Applied optics, 34(4), 1995, pp. 703-708
ATOMIC-FORCE MICROSCOPY SILICON TIPS AS PHOTON TUNNELING SENSORS - A RESONANT EVANESCENT COUPLING EXPERIMENT
Authors: FILLARD JP CASTAGNE M PRIOLEAU C
Citation: Jp. Fillard et al., ATOMIC-FORCE MICROSCOPY SILICON TIPS AS PHOTON TUNNELING SENSORS - A RESONANT EVANESCENT COUPLING EXPERIMENT, Applied optics, 34(19), 1995, pp. 3737-3742
OPTICAL NEAR-FIELD MICROSCOPY - APPLICATI ON TO SEMICONDUCTORS
Authors: FILLARD JP CASTAGNE M PRIOLEAU C
Citation: Jp. Fillard et al., OPTICAL NEAR-FIELD MICROSCOPY - APPLICATI ON TO SEMICONDUCTORS, Microscopy microanalysis microstructures, 5(4-6), 1994, pp. 427-433
PHOTON TUNNELING FROM SEMICONDUCTOR SURFACES TO ATOMIC-FORCE MICROSCOPY PROBES
Authors: FILLARD JP CASTAGNE M PRIOLEAU C BAUDRY E GALL P BONNAFE J
Citation: Jp. Fillard et al., PHOTON TUNNELING FROM SEMICONDUCTOR SURFACES TO ATOMIC-FORCE MICROSCOPY PROBES, Materials science & engineering. B, Solid-state materials for advanced technology, 28(1-3), 1994, pp. 493-496
COMPUTER-SIMULATION OF SUPERRESOLUTION POINT-SOURCE IMAGE DETECTION
Authors: FILLARD JP MTIMET H LUSSERT JM CASTAGNE M
Citation: Jp. Fillard et al., COMPUTER-SIMULATION OF SUPERRESOLUTION POINT-SOURCE IMAGE DETECTION, Optical engineering, 32(11), 1993, pp. 2936-2944
Risultati: 1-9 |