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Authors: OHMORI T CASTRO RJ CABRERA CR

Citation: T. Ohmori et al., IN-SITU STUDY OF SILVER ELECTRODEPOSITION AT MOSE2 BY ELECTROCHEMICALSCANNING-TUNNELING-MICROSCOPY, Langmuir, 14(23), 1998, pp. 6755-6760

Authors: OHMORI T CASTRO RJ CABRERA CR

Citation: T. Ohmori et al., SURFACE MODIFICATION OF MOSE2 IN SOLUTION USING A COMBINED TECHNIQUE OF SCANNING-TUNNELING-MICROSCOPY INDENTATION WITH ELECTROCHEMICAL ETCHING, Langmuir, 14(21), 1998, pp. 6287-6290

Authors: CASTRO RJ CABRERA CR

Citation: Rj. Castro et Cr. Cabrera, PHOTOVOLTAMMETRY AND SURFACE-ANALYSIS OF MOSE2 THIN-FILMS PREPARED BYAN INTERCALATION-EXFOLIATION METHOD, Journal of the Electrochemical Society, 144(9), 1997, pp. 3135-3140

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Authors: CASTRO RJ CABRERA CR

Citation: Rj. Castro et Cr. Cabrera, SILVER PHOTOELECTRODEPOSITION AT P-MOSE2, Langmuir, 11(4), 1995, pp. 1375-1380