Authors:
LAAZIZ Y
BENNOUNA A
ELAZHARI MY
RAMIROBARGUENO J
OUTZOURHIT A
CHAHBOUN N
AMEZIANE EL
Citation: Y. Laaziz et al., A METHOD FOR MONITORING THE THICKNESS OF SEMICONDUCTOR AND DIELECTRICTHIN-FILMS - APPLICATION TO THE DETERMINATION OF LARGE-AREA THICKNESSPROFILES, Thin solid films, 303(1-2), 1997, pp. 255-263
Authors:
ELASSALI K
CHAHBOUN N
BEKKAY T
AMEZIANE EL
BOUSTANI M
KHIARA A
Citation: K. Elassali et al., ELECTRICAL-PROPERTIES OF CUALTE2 THIN-FILMS AND MO CUALTE2 CONTACT PREPARED BY RF-SPUTTERING/, Solar energy materials and solar cells, 39(1), 1995, pp. 33-38