Authors:
BASU PK
CHAKRAVARTY BC
SINGH SN
DUTTA P
KESAVAN R
Citation: Pk. Basu et al., MEASUREMENT OF SHALLOW DOPANT IMPURITY PROFILE IN SILICON USING ANODIC SECTIONING AND LANGE METHOD OF HALL MEASUREMENT, Solar energy materials and solar cells, 43(1), 1996, pp. 15-20
Authors:
CHAKRAVARTY BC
BASU PK
ARORA NK
CHAKRABORTY TK
Citation: Bc. Chakravarty et al., PROCESS-DEVELOPMENT FOR LARGE-AREA TERRESTRIAL SOLAR-CELLS WITHOUT OPTICAL CONFINEMENT, Journal of materials science letters, 15(14), 1996, pp. 1258-1260
Citation: Pk. Basu et al., A NEW METHOD OF DETERMINATION OF MINORITY-CARRIER DIFFUSION LENGTH INTHE BASE REGION OF SILICON SOLAR-CELLS, I.E.E.E. transactions on electron devices, 41(3), 1994, pp. 367-372
Authors:
CHAKRAVARTY BC
ARORA NK
SINGH SN
DAS BK
CHAKRABORTY BR
SEN N
Citation: Bc. Chakravarty et al., IDENTIFICATION OF A MOVING PHASE OF AL2O3 BY AUGER-ELECTRON SPECTROSCOPY IN THE BACK ALUMINIZED SURFACE OF SI, Applied physics letters, 64(21), 1994, pp. 2847-2848