Authors:
TOBIN SP
TOWER JP
NORTON PW
CHANDLERHOROWITZ D
AMIRTHARAJ PM
LOPES VC
DUNCAN WM
SYLLAIOS AJ
ARD CK
GILES NC
LEE J
BALASUBRAMANIAN R
BOLLONG AB
STEINER TW
THEWALT MLW
BOWEN DK
TANNER BK
Citation: Sp. Tobin et al., A COMPARISON OF TECHNIQUES FOR NONDESTRUCTIVE COMPOSITION MEASUREMENTS IN CDZNTE SUBSTRATES, Journal of electronic materials, 24(5), 1995, pp. 697-705
Authors:
DAHMANI R
SALAMANCARIBA L
NGUYEN NV
CHANDLERHOROWITZ D
JONKER BT
Citation: R. Dahmani et al., DETERMINATION OF THE OPTICAL-CONSTANTS OF ZNSE FILMS BY SPECTROSCOPICELLIPSOMETRY, Journal of applied physics, 76(1), 1994, pp. 514-517
Authors:
DAHMANI R
SALAMANCARIBA L
NGUYEN NV
CHANDLERHOROWITZ D
JONKER BT
Citation: R. Dahmani et al., STRAIN EFFECTS ON THE ENERGY-BANDS OF ZNSE FILMS GROWN ON GAAS SUBSTRATES BY SPECTROSCOPIC ELLIPSOMETRY, Applied physics letters, 64(26), 1994, pp. 3620-3622
Authors:
NGUYEN NV
CHANDLERHOROWITZ D
AMIRTHARAJ PM
PELLEGRINO JG
Citation: Nv. Nguyen et al., SPECTROSCOPIC ELLIPSOMETRY DETERMINATION OF THE PROPERTIES OF THE THIN UNDERLYING STRAINED SI LAYER AND THE ROUGHNESS AT SIO2 SI INTERFACE/, Applied physics letters, 64(20), 1994, pp. 2688-2690
Authors:
GUHA S
PEEBLES D
BROWNING V
WIETING T
CHANDLERHOROWITZ D
NORTON M
Citation: S. Guha et al., OPTICAL CONDUCTIVITY OF SINGLE-CRYSTALS OF BA(1-X)M(X)BIO(3) (M=K, RB, X=0.04, 0.37), Journal of superconductivity, 6(5), 1993, pp. 339-349