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Results:
1-17
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Results: 17
Authors:
ORTEGA L
HUANG L
CHEVRIER J
ZEPPENFELD P
GAY JM
RIEUTORD F
COMSA G
Citation: L. Ortega et al., COMBINED X-RAY AND STM STUDY OF THE OXYGEN-INDUCED RESTRUCTURING OF THE AU(111) SURFACE, Surface review and letters, 4(6), 1997, pp. 1315-1319
Authors:
GALLAS B
BERBEZIER I
CHEVRIER J
DERRIEN J
Citation: B. Gallas et al., GALLIUM-MEDIATED HOMOEPITAXIAL GROWTH OF SILICON AT LOW-TEMPERATURES, Physical review. B, Condensed matter, 54(7), 1996, pp. 4919-4925
Authors:
CHEVRIER J
HUANG L
ZEPPENFELD P
COMSA G
Citation: J. Chevrier et al., CHARACTERIZATION BY SCANNING-TUNNELING-MICROSCOPY OF THE OXYGEN-INDUCED RESTRUCTURING OF AU(111), Surface science, 355(1-3), 1996, pp. 1-12
Authors:
HUANG L
ZEPPENFELD P
CHEVRIER J
COMSA G
Citation: L. Huang et al., SURFACE-MORPHOLOGY OF AU(111) AFTER EXPOSURE TO OXYGEN AT HIGH-TEMPERATURE AND PRESSURE, Surface science, 352, 1996, pp. 285-289
Authors:
CHEVRIER J
Citation: J. Chevrier, TANSI,SONY,LABOU - WRITER OF SHAME AND OF THE BANKS OF THE CONGO - FRENCH - DEVESA,JM, Europe-Revue littéraire mensuelle, 74(806-07), 1996, pp. 247-248
Authors:
CHEVRIER J
Citation: J. Chevrier, EXPERIMENTAL-ANALYSIS OF RIVER PATTERNS IN SILICON BRITTLE FRACTURES, Journal de physique. I, 5(6), 1995, pp. 675-683
Authors:
HUANG L
CHEVRIER J
ZEPPENFELD P
COSMA G
Citation: L. Huang et al., OBSERVATION BY SCANNING-TUNNELING-MICROSCOPY OF A HEXAGONAL AU(111) SURFACE RECONSTRUCTION INDUCED BY OXYGEN, Applied physics letters, 66(8), 1995, pp. 935-940
Authors:
CHEVRIER J
CRUZ A
PINTO N
BERBEZIER I
DERRIEN J
Citation: J. Chevrier et al., INFLUENCE OF KINETIC ROUGHENING ON THE EPITAXIAL-GROWTH OF SILICON, Journal de physique. I, 4(9), 1994, pp. 1309-1324
Authors:
CHEVRIER J
SUCK JB
LASJAUNIAS JC
PERROUX M
CAPPONI JJ
Citation: J. Chevrier et al., NONEQUILIBRIUM STATE AND LATTICE INSTABILITY IN SUPERSATURATED ALUMINUM-SILICON SOLID-SOLUTIONS, Physical review. B, Condensed matter, 49(2), 1994, pp. 961-968
Authors:
KOWNATOR S
DUTREYDUPAGNE C
VAUR L
CHEVRIER J
DIESEL J
DHOTEL R
SCHAAF R
COURVOISIER A
BRETON C
Citation: S. Kownator et al., EVALUATION OF THE DURATION OF ACTION OF T RANDOLAPRIL BY AMBULATORY BLOOD-PRESSURE MONITORING, Therapie, 49(2), 1994, pp. 89-93
Authors:
BERBEZIER I
CHEVRIER J
DERRIEN J
Citation: I. Berbezier et al., HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY OF ALPHA-FESI2 HETEROEPITAXY ON SI(111), Surface science, 315(1-2), 1994, pp. 27-39
Authors:
CHEVRIER J
VINH T
DERRIEN J
Citation: J. Chevrier et al., STRAINED AND RELAXED SEMICONDUCTING SILICIDE LAYERS HETEROEPITAXIALLYGROWN ON SILICON, Scanning microscopy, 7(2), 1993, pp. 473-480
Authors:
CHEVRIER J
STOCKER P
VINH L
GAY JM
DERRIEN J
Citation: J. Chevrier et al., EPITAXIAL-GROWTH OF ALPHA-FESI2 ON SI(111) AT LOW-TEMPERATURE, Europhysics letters, 22(6), 1993, pp. 449-454
Authors:
DERRIEN J
CHEVRIER J
VINH LT
BERBEZIER I
GIANNINI C
LAGOMARSINO S
GRIMALDI MG
Citation: J. Derrien et al., SYNTHESIS AND PROPERTIES OF EPITAXIAL SEMICONDUCTING SILICIDES, Applied surface science, 73, 1993, pp. 90-101
Authors:
DERRIEN J
CHEVRIER J
LETHANH V
CRUMBAKER TE
NATOLI JY
BERBEZIER I
Citation: J. Derrien et al., SILICIDE EPILAYERS - RECENT DEVELOPMENTS AND PROSPECTS FOR A SI-COMPATIBLE TECHNOLOGY, Applied surface science, 70-1, 1993, pp. 546-558
Authors:
CHEVRIER J
SUCK JB
LASJAUNIAS JC
Citation: J. Chevrier et al., LATTICE INSTABILITY IN ALUMINUM-SILICON SOLID-SOLUTIONS, Journal of non-crystalline solids, 156, 1993, pp. 564-566
Authors:
MAHAN JE
LETHANH V
CHEVRIER J
BERBEZIER I
DERRIEN J
LONG RG
Citation: Je. Mahan et al., SURFACE ELECTRON-DIFFRACTION PATTERNS OF BETA-FESI2 FILMS EPITAXIALLYGROWN ON SILICON, Journal of applied physics, 74(3), 1993, pp. 1747-1761
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1-17
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