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Results:
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Results: 4
A NONPARAMETRIC BAYES APPROACH TO DECIDE SYSTEM BURN-IN TIME
Authors:
CHIEN WTK KUO W
Citation:
Wtk. Chien et W. Kuo, A NONPARAMETRIC BAYES APPROACH TO DECIDE SYSTEM BURN-IN TIME, Naval research logistics, 44(7), 1997, pp. 655-671
A NONPARAMETRIC APPROACH TO ESTIMATE SYSTEM BURN-IN TIME
Authors:
CHIEN WTK KUO W
Citation:
Wtk. Chien et W. Kuo, A NONPARAMETRIC APPROACH TO ESTIMATE SYSTEM BURN-IN TIME, IEEE transactions on semiconductor manufacturing, 9(3), 1996, pp. 461-467
MODELING AND MAXIMIZING BURN-IN EFFECTIVENESS
Authors:
CHIEN WTK KUO W
Citation:
Wtk. Chien et W. Kuo, MODELING AND MAXIMIZING BURN-IN EFFECTIVENESS, IEEE transactions on reliability, 44(1), 1995, pp. 19-25
USE OF THE DIRICHLET PROCESS FOR RELIABILITY-ANALYSIS
Authors:
CHIEN WTK KUO W
Citation:
Wtk. Chien et W. Kuo, USE OF THE DIRICHLET PROCESS FOR RELIABILITY-ANALYSIS, Computers & industrial engineering, 27(1-4), 1994, pp. 339-343
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