Wtk. Chien et W. Kuo, A NONPARAMETRIC APPROACH TO ESTIMATE SYSTEM BURN-IN TIME, IEEE transactions on semiconductor manufacturing, 9(3), 1996, pp. 461-467
System burn-in can get rid of more residual defects than component and
subsystem burn-ins because incompatibility exists not only among comp
onents, but also among different subsystems and at the system level. T
here are two major disadvantages for performing the system burn-in: th
e high burn-in cost and the complicated failure rate function. This pa
per proposes a nonparametric approach to estimate the optimal system b
urn-in time. The Anderson-Darling statistic is used to check the const
ant failure rate (CFR), and the pool-adjacent-violator (PAV) algorithm
is applied to ''unimodalize'' the failure rate curve. Given experimen
tal data, the system burn-in time can be determined easily without goi
ng through complex parameter estimation and curve fittings.