A NONPARAMETRIC APPROACH TO ESTIMATE SYSTEM BURN-IN TIME

Authors
Citation
Wtk. Chien et W. Kuo, A NONPARAMETRIC APPROACH TO ESTIMATE SYSTEM BURN-IN TIME, IEEE transactions on semiconductor manufacturing, 9(3), 1996, pp. 461-467
Citations number
13
Categorie Soggetti
Engineering, Eletrical & Electronic","Engineering, Manufacturing","Physics, Applied
ISSN journal
08946507
Volume
9
Issue
3
Year of publication
1996
Pages
461 - 467
Database
ISI
SICI code
0894-6507(1996)9:3<461:ANATES>2.0.ZU;2-2
Abstract
System burn-in can get rid of more residual defects than component and subsystem burn-ins because incompatibility exists not only among comp onents, but also among different subsystems and at the system level. T here are two major disadvantages for performing the system burn-in: th e high burn-in cost and the complicated failure rate function. This pa per proposes a nonparametric approach to estimate the optimal system b urn-in time. The Anderson-Darling statistic is used to check the const ant failure rate (CFR), and the pool-adjacent-violator (PAV) algorithm is applied to ''unimodalize'' the failure rate curve. Given experimen tal data, the system burn-in time can be determined easily without goi ng through complex parameter estimation and curve fittings.